Park NX10 AFMPark SystemsVersatile research-grade AFM for advanced nanoscale surface analysis4.7/5.0|2 ReviewsRequest PricingSelect product
Park FX40 AFMPark SystemsAutomated AFM for fast, accurate nanoscale imaging4.4/5.0|2 ReviewsRequest PricingSelect product
Park AFM-IR SpectrometersPark SystemsNanoscale chemical analysis combining atomic force microscopy and infrared spectroscopy0.0/5.0|0 ReviewsRequest PricingSelect product
Park NX15 Atomic Force MicroscopePark SystemsCompact research-grade AFM for versatile nanoscale surface analysis0.0/5.0|0 ReviewsRequest PricingSelect product
Park FX200 Atomic Force MicroscopePark SystemsAdvanced AFM system for high-precision nanoscale surface characterization0.0/5.0|0 ReviewsRequest PricingSelect product
Accurion SIMON EllipsometerPark SystemsImaging spectroscopic ellipsometer for spatially resolved thin film analysis0.0/5.0|0 ReviewsRequest PricingSelect product
Accurion EP4 EllipsometerPark SystemsImaging ellipsometer for precise thin film and surface characterization0.0/5.0|0 ReviewsRequest PricingSelect product
Park NX-Hivac Atomic Force MicroscopePark SystemsHigh-vacuum AFM for controlled-environment nanoscale surface analysis0.0/5.0|0 ReviewsRequest PricingSelect product
Park NX7 Atomic Force MicroscopePark SystemsCompact research AFM for high-resolution nanoscale surface imaging0.0/5.0|0 ReviewsRequest PricingSelect product
Park NX20 Atomic Force MicroscopePark SystemsAdvanced research AFM for high-resolution surface and materials analysis0.0/5.0|0 ReviewsRequest PricingSelect product
