Park NX15 Atomic Force Microscope
Compact research-grade AFM for versatile nanoscale surface analysis
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The Park NX15 Atomic Force Microscope is a compact, research-grade AFM designed to deliver reliable nanoscale surface analysis in laboratories with limited space or diverse measurement needs. Built on Park Systems’ non-contact AFM technology, the NX15 enables accurate imaging and material property measurements while minimizing tip and sample interaction.
The system offers a balanced combination of performance, flexibility, and ease of use, supporting a range of AFM imaging and analysis modes for routine and advanced applications. Its stable mechanical design ensures consistent and repeatable measurements, while the intuitive software environment supports efficient operation for both experienced users and multi-user labs.
The NX15 is well suited for materials science and nanotechnology research requiring dependable AFM performance in a compact form factor.
Key Features:
- Compact AFM platform with non-contact technology
- Accurate nanoscale imaging and surface analysis
- Stable design for repeatable measurements
- User-friendly software for efficient workflows
