Park NX7 Atomic Force Microscope
Compact research AFM for high-resolution nanoscale surface imaging
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The Park NX7 Atomic Force Microscope is a compact, research-grade AFM designed to deliver high-resolution nanoscale surface imaging with reliable performance. Built on Park Systems’ non-contact AFM technology, the NX7 enables accurate topographical and material property measurements while minimizing tip wear and sample damage.
Its small footprint makes the NX7 well suited for laboratories with limited space, shared research environments, or applications requiring a dedicated AFM system without compromising data quality. The system supports a range of AFM imaging and analysis modes, allowing researchers to perform detailed surface characterization across various material types.
With its stable mechanical design and intuitive software interface, the NX7 provides consistent, repeatable results for both routine measurements and advanced research applications in materials science and nanotechnology.
Key Features:
- Compact AFM system with non-contact technology
- High-resolution nanoscale surface imaging
- Stable platform for repeatable measurements
- User-friendly software for efficient operation
