Park AFM-IR Spectrometers
Nanoscale chemical analysis combining atomic force microscopy and infrared spectroscopy
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Park AFM-IR Spectrometers combine atomic force microscopy with infrared spectroscopy to enable chemical characterization at the nanoscale. By correlating high-resolution AFM imaging with localized infrared spectral information, these systems provide detailed insight into both the physical structure and chemical composition of materials.
AFM-IR technology allows users to identify chemical variations and molecular information at spatial resolutions beyond the limits of conventional IR spectroscopy. This makes Park AFM-IR systems particularly valuable for analyzing heterogeneous, multilayer, or nanoscale materials. The non-destructive measurement approach supports analysis of sensitive samples while maintaining high spatial and chemical specificity.
Park AFM-IR Spectrometers are well suited for advanced research applications in materials science, polymer analysis, semiconductor research, and life sciences, where understanding chemical composition at the nanoscale is critical.
Key Features:
- Combined AFM imaging and infrared spectroscopy
- Nanoscale chemical and structural characterization
- Correlative analysis of morphology and composition
- Suitable for advanced research applications
