Park NX-Hivac Atomic Force Microscope
High-vacuum AFM for controlled-environment nanoscale surface analysis
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The Park NX-Hivac Atomic Force Microscope is a high-vacuum AFM system designed for nanoscale surface characterization under controlled environmental conditions. By operating in vacuum, the NX-Hivac reduces the influence of air, humidity, and contamination, enabling more stable and reliable measurements of sensitive and advanced materials.
Built on Park Systems’ non-contact AFM technology, the NX-Hivac provides accurate topographical and material property measurements while minimizing tip and sample damage. Its vacuum-compatible design supports high-resolution imaging and repeatable data acquisition, making it suitable for demanding research applications.
The NX-Hivac is well suited for advanced materials science and semiconductor research, where precise surface analysis under controlled conditions is essential.
Key Features:
- High-vacuum AFM operation for controlled measurements
- Non-contact AFM technology for accurate, low-damage imaging
- Reduced environmental influence on surface analysis
- Designed for advanced research applications
