Park FX200 Atomic Force Microscope
Advanced AFM system for high-precision nanoscale surface characterization
Receive your quote directly from the manufacturer.
The Park FX200 Atomic Force Microscope is an advanced AFM system designed for high-precision nanoscale surface characterization in demanding research and industrial environments. It is built on Park Systems’ non-contact AFM technology, enabling accurate topographical and material property measurements while minimizing sample and tip damage.
The FX200 is optimized for applications that require enhanced stability, measurement reliability, and advanced analysis capabilities. Its robust mechanical design and low-noise performance support consistent, high-quality data acquisition across a wide range of materials. The system accommodates multiple AFM imaging and measurement modes, allowing researchers to address complex surface and materials science challenges.
With its combination of performance, flexibility, and reliability, the FX200 is well suited for advanced materials research and semiconductor-related applications.
Key Features:
- Non-contact AFM technology for precise, low-damage measurements
- Enhanced mechanical stability for demanding applications
- Support for advanced imaging and analysis modes
- Designed for high-performance research environments
