Park NX10 AFM
Versatile research-grade AFM for advanced nanoscale surface analysis
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Great results and nice instrument to get.
Nanoscale characterization of thin films / 2D materials
Nice product. Various modes available for diverse range of applications.
Review Date: 28 Mar 2021 | Park Systems
Excellent control and precision.
Organic semiconductor thin film morphology
I have been using the Park NX10 from one and a half years. I am work on organic thin film based devices where surface morphology plays a crucial role in device performance. In order to get a qualitative understanding of the device's physics, the Park NX10 has been a crucial tool for me.
Review Date: 17 Apr 2020 | Park Systems
The Park NX10 Atomic Force Microscope is a versatile, research-grade AFM designed for advanced nanoscale surface characterization across a wide range of materials. It is built on Park Systems’ non-contact AFM technology, enabling accurate topographical and material property measurements while minimizing tip wear and sample damage.
The NX10 supports multiple AFM imaging and analysis modes, making it suitable for both routine measurements and advanced research applications. Its rigid mechanical design and low-noise performance provide stable and repeatable results, even for challenging samples. Combined with an intuitive software interface, the NX10 allows researchers to efficiently acquire high-quality nanoscale data.
The system is well suited for multidisciplinary research environments requiring flexibility, precision, and reliable performance in surface and materials analysis.
Key Features:
- Non-contact AFM technology for accurate, low-damage imaging
- Support for multiple imaging and analysis modes
- High mechanical stability for reproducible measurements
- User-friendly software for efficient research workflows
