Accurion SIMON Ellipsometer
Imaging spectroscopic ellipsometer for spatially resolved thin film analysis
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The Park Simon Imaging Spectroscopic Ellipsometer is an advanced optical measurement system designed for spatially resolved characterization of thin films and material surfaces. By combining imaging ellipsometry with spectroscopic analysis, Simon enables detailed evaluation of film thickness and optical properties across a sample area.
The system provides non-contact optical measurements, making it suitable for analyzing sensitive thin films, coatings, and layered materials without altering the sample. Its imaging capability allows users to assess film uniformity and spatial variations, while spectroscopic ellipsometry supports accurate material characterization across a range of wavelengths.
Park Simon is well suited for research and development applications in materials science, semiconductor research, and advanced coatings, where precise and reliable thin film analysis is required.
Key Features:
- Imaging spectroscopic ellipsometry for spatially resolved analysis
- Non-contact optical thin film characterization
- Measurement of thickness and optical properties
- Suitable for research and development environments
