Accurion EP4 Ellipsometer
Imaging ellipsometer for precise thin film and surface characterization
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The Park EP4 Imaging Ellipsometer is a high-performance optical measurement system designed for precise thin film and surface characterization. By combining ellipsometric measurement with imaging capabilities, the EP4 enables spatially resolved analysis of film thickness and optical properties across a sample surface.
The system is well suited for analyzing thin films, coatings, and layered materials used in research and industrial environments. Its non-contact, optical measurement approach allows accurate characterization without altering or damaging sensitive samples. The EP4 supports efficient measurement workflows and provides detailed insight into film uniformity and material properties.
The Park EP4 Imaging Ellipsometer is ideal for applications in materials science, semiconductor research, and advanced coatings development, where precise and reliable thin film analysis is essential.
Key Features:
- Imaging ellipsometry for spatially resolved measurements
- Non-contact optical characterization of thin films
- Accurate thickness and optical property analysis
- Suitable for research and industrial applications
