RISE Microscopy - Correlative Raman Imaging and Scanning Electron Microscopy (Raman-SEM)

RISE Microscopy is a novel correlative microscopy technique that combines SEM and confocal Raman Imaging and links ultra-structural surface properties to molecular compound information.

RISE Microscopy combines an SEM and a confocal Raman microscope. The confocal Raman microscope is integrated into the vacuum chamber of the electron microscope. Non-destructive Raman and SEM measurements are consecutively performed at two different positions inside this chamber using an automatic transfer stage. Calibration of the sample position ensures scanning of the same sample area in both SEM and Raman modes.

The integrated RISE software carries out the required parameter adjustments and instrument alignments. The acquired results can then be correlated and the Raman and SEM images overlaid. RISE Microscopy pairs ease-of-use with exceptional analyzing benefits and is therefore suited for a wide variety of applications such as nanotechnology, materials science, and life science.


Features:

• Quick and convenient switching between Raman and SEM measurement
• Automated sample transfer from one measuring position to the other
• Integrated software interface for user-friendly measurement control
• Correlation of the measurement results and image overlay
• No compromise in SEM and Raman imaging capabilities

Applications:

• All fields of application that require a comprehensive and detailed sample analysis, e.g. materials science, pharmaceutical science and industry, geo science, nanotechnology, life science etc…