HYPERION II
HYPERION II is a high-performance FT-IR and laser imaging microscope, merging traditional FT-IR microscopy with QCL technology in one configurable research platform, offering high spatial resolution, powerful imaging options, and complete control over every measurement parameter.
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The HYPERION II empowers researchers with full experimental control through freely configurable detectors, optics, and imaging modes, ensuring every measurement is tailored to the sample and scientific objective. By unifying FT-IR and QCL technologies in one platform, it expands analytical possibilities, from broad band spectroscopy to ultrafast, diffraction limited laser imaging, without compromising workflow simplicity.
Its versatile accessory ecosystem, including temperature controlled stages, macro ATR, and universal sample holders, streamlines handling of diverse and challenging specimens. This flexibility, combined with high resolution IR imaging capabilities, delivers deeper insights into complex structures and chemical distributions. With the freedom to choose the optimal detector and optical setup for each task, the HYPERION II removes analytical barriers and elevates micro spectroscopic research across all applications.
Key features:
• Achieve diffraction-limited IR imaging with high-sensitivity focal-plane array detection.
• Easy switch between all modes: transmis¬sion, reflection, ATR, FT-IR or QCL.
• Tailor experiments with a wide selection of detectors, optics and accessories.
• Combine full-spectrum FT-IR and IR laser imaging within a single instrument.
• Reduce imaging artefacts and improve clarity with patented laser coherence control.
Relevant applications
• Microplastics, polymers, multilayer structures, and materials science imaging.
• Pharmaceutical tablet mapping, contaminant identification, and quality control.
• Biological tissue and cell imaging with ultrafast acquisition for clinical and research workflows.
• PCB cleanliness, embedded components, and precision mechanics inspection.
• Emission microscopy, spectral profiling of IR emitters, and advanced optical materials studies.
