VERTEX NEO R
The VERTEX NEO R represents the new generation of vacuum FT-IR spectrometers, designed to set new standards in advanced research applications. With an emphasis on flexibility, precision, and innovation, it delivers the ultimate support for cutting-edge scientific exploration.
The advanced electronics of the VERTEX NEO R enable faster data acquisition, making it ideal for time-resolved measurements of repeatable and triggerable processes. Its innovative interleaved algorithm eliminates time window constraints, allowing continuous, long-duration monitoring. This breakthrough opens new possibilities, expanding research capabilities like never before.
Key features:
- Full-vacuum optics for maximum stability and sensitivity.
- Unique vacuum ATR with accessible sample stage for easy handling.
- RockSolid™ interferometer with aluminum-coated optics and 30° incidence for efficiency.
- MultiTect™ supports up to 5 detectors; DigiTect™ for specialized detectors.
- Ample space for MCTs with 12–24 h holding time (optional cover).
- Dual-channel 24-bit ADC for fully digitized signal processing.
- Easy upgrades for near IR, far IR, and VIS/UV ranges.
- Touch panel with OPUS TOUCH software for intuitive and advanced R&D workflows.
- Software-selectable 5 exit and 2 input beam ports.
- Superior Rapid, Slow, Step, and Interleaved TRS scanning modes for time-resolved measurements.
- THz extension with a separated optical path.
- Compatible with VERTEX and INVENIO modules and accessories.
- Large compartment for bulky accessories.
- LED light bar indicates instrument status.
TechTalk: Advancing energy storage with spectroelectrochemistry
Thursday, February 5 at 18:00 GMT | 19:00 CET | 13:00 EST | 10:00 PST
Developing next‑generation energy storage systems demands a deeper, more precise understanding of electrochemical behavior, including how to optimize electrode composition and ensure chemical homogeneity throughout the electrode structure. Combining electrochemistry with Infrared and Raman spectroscopy offers a powerful approach for achieving these goals. Pairing these techniques with microscopy further enables micrometer-scale insights into chemical composition and distribution.
This SelectScience TechTalk will explore how these capabilities come together with four key instruments that make this integrated approach possible: INVENIO, RAMANtouch, HYPERION II and VERTEX NEO R.
Join Dr. Sergey Shilov, Senior Application Scientist, Bruker Optics, as he shares his 40+ years of FTIR and Raman knowledge to inspire and accelerate your research in batteries, fuel cells, and advanced energy materials.
Certificate of attendance
If you attend the live TechTalk, you will automatically receive a certificate of attendance, including a learning outcomes summary, for continuing education purposes. If you view the on-demand TechTalk, you can request a certificate of attendance by emailing editor@selectscience.net.
TechTalk details
- Cost: Free to attend
- Location: Online
- Duration: 20 minutes
Registration is required to secure your place. If you register but can’t attend live, you will receive a link to the on‑demand recording once it becomes available.



















