RISE Microscopy Chosen as 2015 Prism Award Finalist
2 Dec 2014
RISE Microscopy has been nominated for a 2015 Photonics Prism Award. These well-respected product innovation awards honor the best new photonic products on the market and are each year presented by SPIE and Photonics Media at a gala event during Photonics West in San Francisco.
RISE microscopy is a correlative microscopy technique combining the chemical analysis power of Raman imaging with the ultra-structural characterization capabilities of a scanning electron microscope in an integrated system. It is a joint development of WITec and the Czech electron microscope manufacturer Tescan. Both development teams are delighted to become part of the elite group of innovators in consideration for a Prism Award. For WITec this is the second nomination after ultimately winning in 2012 with TrueSurface Microscopy for topographic confocal Raman imaging.
“We are thrilled to be among the finalists again”, said Dr. Olaf Hollricher, Managing Director R&D of WITec. “This nomination is a great honor for WITec and can be considered further validation of our technological strategy: Providing cutting-edge products for ambitious scientific customers.”
Correlative microscopy is an ongoing trend in microscopy. With a modular optical design WITec addressed early on the ability to combine various complementary techniques in integrated system configurations such as Raman-AFM or TrueSurface Microscopy. RISE, which stands for Raman Imaging & Scanning Electron Microscopy, is a novel technique which enables for the first time the acquisition of SEM and Raman images from the same sample area and the correlation of ultra-structural and chemical information with one microscope system.
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RISE Microscopy - Correlative Raman Imaging and Scanning Electron Microscopy (Raman-SEM)
Oxford Instruments RamanRISE Microscopy is a novel correlative microscopy technique that combines SEM and confocal Raman Imaging and links ultra-structural surface properties to molecular compound information. RISE Microscopy combines an SEM and a confocal Raman microscope. The confocal Raman microscope is integrated into the vacuum chamber of the electron microscope. Non-destructive Raman and SEM measurements are consecutively performed at two different positions inside this chamber using an automatic transfer stage. Calibration of the sample position ensures scanning of the same sample area in both SEM and Raman modes.The integrated RISE software carries out the required parameter adjustments and instrument alignments. The acquired results can then be correlated and the Raman and SEM images overlaid. RISE Microscopy pairs ease-of-use with exceptional analyzing benefits and is therefore suited for a wide variety of applications such as nanotechnology, materials science, and life science.Features: Quick and convenient switching between Raman and SEM measurement Automated sample transfer from one measuring position to the other Integrated software interface for user-friendly measurement control Correlation of the measurement results and image overlay No compromise in SEM and Raman imaging capabilities Applications: All fields of application that require a comprehensive and detailed sample analysis, e.g. materials science, pharmaceutical science and industry, geo science, nanotechnology, life science etc…