Confocal Raman Imaging, Correlative Raman-SEM, and Atomic Force Microscopy: Geo-Science Applications

Scanning Probe Microscope Series WITec alpha300 The WITec microscopy series features scanning probe as well as high resolution optical and Raman microscopy techniques in either a single instrument or combined system configurations for the highest flexibility throughout a wide range of microscopy applications. For example, it is possible to start with Confocal Raman Microscopy and upgrade later to Atomic Force Microscopy or vice versa. With such a combined instrument, chemical information can be directly linked to structural AFM information from the same sample area using only one instrument. For high-resolution optical information, the system can even be equipped with SNOM capabilities. All of these methods enable nondestructive sample analysis on the nanometer scale while requiring only minimal sample preparation, if any. This extensive modularity and ease of use facilitates a more comprehensive understanding of the sample. Typical applications are found in all fields of surface and materials science, geosciences, life science, pharmaceutical research, thin films and coating analysis as well as nanophotonics and nanotechnology. WITec’s technological leadership and the high-quality design of the alpha300 series pushes the frontiers of high-resolution Raman- and SPM-imaging abilities even further. This will aid our customers as they endeavor to become leaders in their varied fields.

True Surface Microscopy - Confocal Microscopy Along with Large Area Optical Profiling WITec´s new True Surface Microscopy option (patent pending) allows confocal Raman imaging guided by surface topography. Confocal microscopy is often desirable due to its suppression of out-of-focus light but can be challenging when analyzing large or rough surfaces. In these cases, only those points that are in focus contribute to the image. True Surface Microscopy follows the surface topography with high precision, so that even rough or inclined samples always stay in focus. To achieve this unique capability, the WITec alpha500 series can be equipped with a highly precise sensor for optical profilometry. The topographic coordinates from the profilometer measurement are used to perfectly follow the sample surface in confocal Raman imaging mode. The result is an image revealing chemical properties at the surface of the sample, even if this surface is rough or inclined. True Surface Microscopy Features: Extension for the WITec alpha500 series that combines Large-area surface topography profiling with confocal Raman imaging: Topographic confocal Raman imaging Topographic large-area Surface imaging Topographic spectroscopic imaging Unique combination (patent pending) delivers innovative application possibilities for new research techniques Ease-of-use through full integration with the alphaControl hardware and WITec Project software environment Scan speed up to 2000 pixels/s for rapid data acquisition Spatial resolution of 10 - 25 μm laterally and Light source: High intensity LED for highest throughput, accuracy and longevity Measuring distance: 10 mm – 16 mm providing wide-ranging sample size flexibility Multi-sensors easily configurable to meet virtually any application

RISE Microscopy is a novel correlative microscopy technique that combines SEM and confocal Raman Imaging and links ultra-structural surface properties to molecular compound information. RISE Microscopy combines an SEM and a confocal Raman microscope. The confocal Raman microscope is integrated into the vacuum chamber of the electron microscope. Non-destructive Raman and SEM measurements are consecutively performed at two different positions inside this chamber using an automatic transfer stage. Calibration of the sample position ensures scanning of the same sample area in both SEM and Raman modes.The integrated RISE software carries out the required parameter adjustments and instrument alignments. The acquired results can then be correlated and the Raman and SEM images overlaid. RISE Microscopy pairs ease-of-use with exceptional analyzing benefits and is therefore suited for a wide variety of applications such as nanotechnology, materials science, and life science.Features: Quick and convenient switching between Raman and SEM measurement Automated sample transfer from one measuring position to the other Integrated software interface for user-friendly measurement control Correlation of the measurement results and image overlay No compromise in SEM and Raman imaging capabilities Applications: All fields of application that require a comprehensive and detailed sample analysis, e.g. materials science, pharmaceutical science and industry, geo science, nanotechnology, life science etc…