Electron Microscopy Products & Reviews

UV-Ozone Sample Cleaner for TEM

Compact SEM with low vacuum function

UV-Ozone Sample Cleaner for SEM

JEM-120i

SiN Window Chip

Standard Ar+ cross-section and surface polisher

High-Resolution FE-SEM with Cold Field Emitter

FIB-SEM for the semiconductor sector with 200mm wafer coverage

SMILE VIEW™ Map software

FIB-SEM for the highest demands on TEM samples

miXcroscopy™ Linked Optical & Scanning Electron Microscopy System

JEM-Z200FSC CRYO ARM200

Purpose-built for Electron Energy Loss Spectroscopy (EELS), MerlinEELS delivers exceptional speed, precision, and sensitivity. Ideal for advanced elemental analysis, chemical bonding studies, and energy-filtered TEM imaging and diffraction in both research and industrial settings.

Segmentation of subcellular structures from 3-dimensional electron microscopy (EM) data

High-Resolution and Analytical Schottky VP FE-SEM with Large Sample Chamber

EC-52000IC (Ion Cleaner)

Modular VP-SEM platform, available with two different sample chambers and two types of electron optics

Designed with 4D-STEM and electron diffraction in mind, the Merlin RDP offers fast, continuous readout with high dynamic range and DQE, all in a highly compact and retractable platform built on the Medipix3 chip. Ideal for 4D-STEM and 3D ED/MicroED of samples from different fields, including materials science, pharmaceuticals, and biology.

Inlens FE-SEM and STEM

60-200kV ETEM with maximum resolution

JEC-3000FC (Auto Fine Coater)

Designed to meet the needs of academic researchers and Original Equipment Manufacturers (OEMs), the ORCA®-Halo camera combines cutting-edge reliable technology with excellent image quality performance setting a new standard for back-illuminated sensor cameras.

Excimer UV Cleaner SM-92100EUVC

The H-9500 is a high performance TEM featuring a single crystal LaB6 electron source. This allows 0.102 nm crystal lattice resolution and 0.18 nm point to point to be achieved. The instrument features a low magnification operating mode of x200 to x500 and a high magnification mode with zoom from x1000 to x1,500,000. Fully PC-controlled, the instrument has an icon-driven user interface and is designed for very fast operation. W…

The S-3700N features an ultra large specimen chamber and stage to allow observation of specimens at diameters up to 300mm. Hitachi Variable Pressure SEM (VP-SEM) series have been received with high reputation from customers around the world. They feature low vacuum observation method (6 – 270 Pa) which enables observation of non-conductive samples like electronic components, and water containing samples such as cultured cells,…