Electron Microscopy Products & Reviews

Modular VP-SEM platform, available with two different sample chambers and two types of electron optics

Inlens FE-SEM and STEM

60-200kV ETEM with maximum resolution

The Triple Ion Beam Cutter, EM TIC 3X allows production of cross sections of hard/soft, porous, heat sensitive, brittle and heterogeneous material for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations. 

Ensure the ultrastructures of your tissue samples can be precisely compared every time by preparing them with the EM TP tissue processor. 

The EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques.

Developed in cooperation with leading scientists, the EM ACE coater family covers all the requirements for your sample preparation needs, from coating to freeze fracture. 

Leica's cryo-electron tomography workflow solution: boost your productivity with a seamless sample preparation workflow.

This 4th generation Neoscope incorporates advanced technology and functions that make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in minutes.  It is equipped with a large chamber, high and low vacuum modes, secondary and backscatter electron detectors, real-time 3D imaging, highly-advanced auto functions and the option to add a fully embedded EDS with real-time, ‘Live’…

High-vacuum specimen preparation device that makes it easy to prepare samples for imaging and analysis with electron microscopes.

Sputter Coater

Carbon Coater

Thin Film Specimen Preparation

Multipurpose Analytical S/TEM

Atomic Resolution S/TEM

200kV Monochromated S/TEM

Field Emission EPMA

LaB6 EPMA

Focused Ion Beam Milling & Imaging System

Direct Write E-beam Lithography System

Direct Write E-beam Lithography System

E-Beam Mask/Reticle Writer

Atomic Resolution TEM

Field Emission Cryo-electron Microscope

High-throughput Analytical S/TEM