HT7800 Family
Hitachi High-Tech EuropeThe fully digital TEM / STEM for all applications, available in 3 models
Electron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.
The fully digital TEM / STEM for all applications, available in 3 models
Merlin T4 is a cutting-edge hybrid pixel detector engineered for ultrafast applications in STEMs. Ideal for 4D-STEM, ultrafast diffraction, and ultrafast TEM imaging of dynamic processes from all types of samples, including beam-sensitive materials.
miXcroscopy™ Linked Optical & Scanning Electron Microscopy System
Purpose-built for Electron Energy Loss Spectroscopy (EELS), MerlinEELS delivers exceptional speed, precision, and sensitivity. Ideal for advanced elemental analysis, chemical bonding studies, and energy-filtered TEM imaging and diffraction in both research and industrial settings.
Segmentation of subcellular structures from 3-dimensional electron microscopy (EM) data
High-Resolution and Analytical Schottky VP FE-SEM with Large Sample Chamber
Modular VP-SEM platform, available with two different sample chambers and two types of electron optics
Designed with 4D-STEM and electron diffraction in mind, the Merlin RDP offers fast, continuous readout with high dynamic range and DQE, all in a highly compact and retractable platform built on the Medipix3 chip. Ideal for 4D-STEM and 3D ED/MicroED of samples from different fields, including materials science, pharmaceuticals, and biology.