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HF5000

60-200kV ETEM with maximum resolution

Hitachi High-Tech Europe

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The HF5000 is a Cs-corrected S/TEM customisable for in-situ experiments. The special feature is provided by the Everhart Thornley SE detector, which images the surface of the sample at 60-200kV, just like in an SEM. This is particularly advantageous for gas & heating in-situ experiments, in which gas reacts with the surface of the sample. Thanks to the Cs-corrector, the surface can be visualised with atomic resolution. The routine and fast switching between TEM and STEM makes daily work with a fully automated Cs corrector easy, even for beginners in the field of TEM.

Product features:

  • Cold field emission electron source with energetically narrow band emission, ideal for high-resolution imaging and EELS
  • Hitachi STEM Cs corrector, fully automated
  • Secondary electron detector for superimposed information on sample surface in correlation to signal of transmitted electrons
  • ETEM experiments e.g. possible in an open gas atmosphere

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