Park NX12 AFM

Park NX12 is a specialized atomic force microscopy designed for researchers who require nanoscale imaging and property characterization in both liquid and ambient environments. Built on Park Systems' True Non-Contact™ AFM technology, the NX12 integrates scanning probe techniques with inverted optical microscopy to deliver accurate, correlative analysis across multiple length scales while minimizing sample damage.

The system supports a wide range of specialized techniques, including SICM, SICM-SECM, and SECCM, enabling detailed electrochemical and ionic imaging alongside standard topographical measurements. Its orthogonal scan architecture and fast Z servo ensure stable, high-resolution imaging performance, even for dynamic or challenging samples.

Key Features:

• True Non-Contact™ AFM technology for accurate, low-damage measurements
• Integration with inverted optical microscopy for correlative, multi-scale analysis
• Fast Z servo with stacked piezo actuator for consistent high resolution
• Support for SICM, SICM-SECM, and SECCM nanopipette-based techniques
• User-friendly Park SmartScan™ and Park SmartAnalysis™ software