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SiN Window Chip

JEOL USASiN Window Chip

SiN Window Chip

JEOL USA

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Description

The high-strength SiN film enables us to observe a serially large area of a millimeter in size. It is also ideal for observation of serially sliced sections because there is no invisible area that is caused by conventional TEM grids. The dedicated retainer makes it easy to perform Correlative Light and Electron Microscopy (CLEM).
To use CLEM retainer (SiN Window Chip starter kit), the EM-21010 common specimen holder and SiN Window Chips (20 chips / case) are required separately.

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