IM4000 II/IM4000 II-CTC
Standard Ar+ cross-section and surface polisher

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IM4000 II is a modular computer-controlled argon ion polishing system that can be equipped as a pure surface polisher, as a cross-section polisher or as a hybrid system, depending on the desired functionality. With a beam energy selectable in 100eV steps from 0.1keV to 6.0keV, a wide range of applications can be covered, from the finest polishes to larger cross-sections. In cross-section operation, IM4000 II achieves a maximum removal rate in Si of 500µm/hour (6keV, protrusion over the mask edge 100µm, stage oscillation ±30°). Functions such as auto-start/time preselection, interval polishing or two-stage processes are available. The IM4000 II-CTC offers the option of process temperatures down to -100°C in cross-section operation.
Product features:
- Single, robust and maintenance-friendly Penning-type ion gun with independent control of beam current and acceleration voltage. Allows intensive ion beams at all acceleration voltages (0-6kV)
- Cross-sectional process depth in Si with 100µm protrusion above mask, stage oscillation +/-30°, is 500µm per hour or more
- Surface polishing can be carried out at tilt angles from 0° to 90°, angle can be changed during the process
- Large sample chamber with a fully retractable multi-axis stage attached to the chamber door to accommodate the various application modules
Brochures
Hitachi Product Catalogue 2024/25- German
In this brochure, Hitachi High-Technologies present a wide range of electron microscopes and ion beam systems available, organised by product class, in German. Each tool is designed to reliably meet your application needs.
Hitachi Product Catalogue 2024/25- English
In this brochure, Hitachi High-Technologies present a wide range of electron microscopes and ion beam systems available, organised by product class. Each tool is designed to reliably meet your application needs.
Broad ion beam milling with Hitachi’s IM4000II & ArBlade 5000
In this application note, Hitachi High-Tech Europe has compiled answers to some of the frequently asked questions, to help you decide whether ion milling is the right solution for your lab.
Optimizing SEM sample preparation with broad ion beam milling
In this application note, Hitachi High-Tech Europe has compiled answers to some of the frequently asked questions, to help you understand how ion milling can enhance your SEM workflow.





