Hitachi High-Tech Europe Products &amp; Reviews

The tabletop microscope for quick and easy SEM imaging and elemental analysis

4.8/5.0

|3 Reviews

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SU8700

High-Resolution Schottky VP FE-SEM

0.0/5.0

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ArBlade 5000 II/IM5000 II-CTC

High-performance Ar+ ion polisher

0.0/5.0

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NX9000

FIB-SEM optimised for large-volume 3D examinations

0.0/5.0

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HT7800 Family

The fully digital TEM / STEM for all applications, available in 3 models

0.0/5.0

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ZoneTEM II

UV-Ozone Sample Cleaner for TEM

0.0/5.0

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FLEXSEM II

Compact SEM with low vacuum function

0.0/5.0

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ZoneSEM II

UV-Ozone Sample Cleaner for SEM

0.0/5.0

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IM4000 II/IM4000 II-CTC

Standard Ar+ cross-section and surface polisher

0.0/5.0

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SU8600

High-Resolution FE-SEM with Cold Field Emitter

0.0/5.0

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NX2000

FIB-SEM for the semiconductor sector with 200mm wafer coverage

0.0/5.0

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NX5000

FIB-SEM for the highest demands on TEM samples

0.0/5.0

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SU7000

High-Resolution and Analytical Schottky VP FE-SEM with Large Sample Chamber

0.0/5.0

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SU3800/SU3900 Family

Modular VP-SEM platform, available with two different sample chambers and two types of electron optics

0.0/5.0

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SU9000 II

Inlens FE-SEM and STEM

0.0/5.0

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HF5000

60-200kV ETEM with maximum resolution

0.0/5.0