Member since: 2013
Organization: Institute of Chemical Technology
Excellent benchtop model, a must for crystal studies.
Application Area: Surface area analysis and crystal nature
"Ideally suited for quick and detailed analysis, ease of operation and excellent reproducibility."
New 6th-generation general purpose benchtop XRD system for phase identification and phase quantification.
New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.