ResourceSpectroscopy

Data Collection and Processing for Single Crystal X-ray Analysis

Data Collection and Processing for Single Crystal X-ray Analysis

8 Jan 2016

Data collection and processing have a significant impact on the structure analysis step. Considering the power of current direct method programs, quality data is nearly equal in importance to obtaining the initial structure, when crystallographic difficulties such as an ambiguous space group and twining are not involved. This application note discusses problems and measures in obtaining diffraction data using two-dimensional detectors: a CCD and an IP detector.

MiniFlex Benchtop XRD

Rigaku Corporation

New 6th-generation general purpose benchtop XRD system for phase identification and phase quantification. New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.   Overview: New 6th generation design Compact, fail-safe radiation enclosure Incident beam variable slit Simple installation and user training Factory aligned goniometer system Laptop computer operation Measurements: Phase identification Phase quantification Percent (%) crystallinity Crystallite size and strain Lattice parameter refinement Rietveld refinement Molecular structure Options: 8-position autosampler Graphite monochromator D/teX Ultra: silicon strip detector HyPix-400 MF: 2D HPAD detector Air sensitive sample holder Travel case

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Data Collection and Processing for Single Crystal X-ray Analysis