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Advancing materials engineering with microscopy

19 Jul 2024

Application Notes

Factors to consider when selecting a camera for life science research

10 Jan 2024

Application Notes

Microscopic characterization of polymer fibers with mechanical properties similar to dragline spider silk

6 Nov 2023

Application Notes

Hysitron TI 980 TriboIndenter

24 Jul 2023

Application Notes

Material joining: Characterization of laser beam welding

23 Jul 2023

Application Notes

Investigating wear and nanomechanics of thin hard coatings on steel

23 Jul 2023

Application Notes

Mechanical characterization of corrosion-resistant coatings

23 Jul 2023

Application Notes

Strength engineering in a nickel-base superalloy

17 Jul 2023

Application Notes

High-temperature investigation of a thermal barrier coating

17 Jul 2023

Application Notes

In-situ electromechanical testing of ZnO nanowires

6 Jul 2023

Application Notes

High-resolution chemical imaging with tapping AFM-IR

27 Jun 2023

Application Notes

Chemical characterization of polymeric films, blends, and self-assembled monomers

27 Jun 2023

Application Notes

Utilizing nanoscale IR spectroscopy to characterize biological samples in nanoscale detail

27 Jun 2023

Application Notes

nanoIR3 nanoscale IR spectroscopy

27 Jun 2023

Application Notes

Improving additive manufacturing with accurate surface metrology

25 Jun 2023

Application Notes

Advantages of measuring surface roughness with white light interferometry

25 Jun 2023

Application Notes

Achieving gage-capable process control for high-speed, precision manufacturing

25 Jun 2023

Application Notes

DektakXT Stylus Profiler

25 Jun 2023

Application Notes

ContourX 3D optical profilometers

25 Jun 2023

Application Notes

Nanoscale mapping of permittivity and conductivity with scanning microwave impedance microscopy

22 Jun 2023

Application Notes

An introduction to AFM-based scanning electrochemical microscopy: PeakForce SECM

22 Jun 2023

Application Notes

Improving the accuracy of nanomechanical measurements with force-curve-based AFM techniques

22 Jun 2023

Application Notes

Performing hyperspectral mapping with AFM DataCube nanoelectrical modes

22 Jun 2023

Application Notes

Measuring nanoscale viscoelastic properties with AFM-based nanoscale DMA

22 Jun 2023

Application Notes

Deep learning to classify and establish structure property predictions with PeakForce QNM atomic force microscopy

22 Jun 2023

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Selected Filters:

Advancing materials engineering with microscopy

Factors to consider when selecting a camera for life science research

Microscopic characterization of polymer fibers with mechanical properties similar to dragline spider silk

Hysitron TI 980 TriboIndenter

Material joining: Characterization of laser beam welding

Investigating wear and nanomechanics of thin hard coatings on steel

Mechanical characterization of corrosion-resistant coatings

Strength engineering in a nickel-base superalloy

High-temperature investigation of a thermal barrier coating

In-situ electromechanical testing of ZnO nanowires

High-resolution chemical imaging with tapping AFM-IR

Chemical characterization of polymeric films, blends, and self-assembled monomers

Utilizing nanoscale IR spectroscopy to characterize biological samples in nanoscale detail

nanoIR3 nanoscale IR spectroscopy

Improving additive manufacturing with accurate surface metrology

Advantages of measuring surface roughness with white light interferometry

Achieving gage-capable process control for high-speed, precision manufacturing

DektakXT Stylus Profiler

ContourX 3D optical profilometers

Nanoscale mapping of permittivity and conductivity with scanning microwave impedance microscopy

An introduction to AFM-based scanning electrochemical microscopy: PeakForce SECM

Improving the accuracy of nanomechanical measurements with force-curve-based AFM techniques

Performing hyperspectral mapping with AFM DataCube nanoelectrical modes

Measuring nanoscale viscoelastic properties with AFM-based nanoscale DMA

Deep learning to classify and establish structure property predictions with PeakForce QNM atomic force microscopy

Resources

Resources FilterResources Filter

Search

Selected Filters:

Advancing materials engineering with microscopy

Factors to consider when selecting a camera for life science research

Microscopic characterization of polymer fibers with mechanical properties similar to dragline spider silk

Hysitron TI 980 TriboIndenter

Material joining: Characterization of laser beam welding

Investigating wear and nanomechanics of thin hard coatings on steel

Mechanical characterization of corrosion-resistant coatings

Strength engineering in a nickel-base superalloy

High-temperature investigation of a thermal barrier coating

In-situ electromechanical testing of ZnO nanowires

High-resolution chemical imaging with tapping AFM-IR

Chemical characterization of polymeric films, blends, and self-assembled monomers

Utilizing nanoscale IR spectroscopy to characterize biological samples in nanoscale detail

nanoIR3 nanoscale IR spectroscopy

Improving additive manufacturing with accurate surface metrology

Advantages of measuring surface roughness with white light interferometry

Achieving gage-capable process control for high-speed, precision manufacturing

DektakXT Stylus Profiler

ContourX 3D optical profilometers

Nanoscale mapping of permittivity and conductivity with scanning microwave impedance microscopy

An introduction to AFM-based scanning electrochemical microscopy: PeakForce SECM

Improving the accuracy of nanomechanical measurements with force-curve-based AFM techniques

Performing hyperspectral mapping with AFM DataCube nanoelectrical modes

Measuring nanoscale viscoelastic properties with AFM-based nanoscale DMA

Deep learning to classify and establish structure property predictions with PeakForce QNM atomic force microscopy

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