ContourX 3D optical profilometers
25 Jun 2023In this application note, Bruker Nano provides a detailed overview of its range of benchtop profilometers. The ContourX suite of benchtop profilometers features the latest measurement hardware and analysis advances to provide gage-capable, quantitative 3D surface characterization for an extremely wide range of surfaces, from rough to smooth, bright to dark, transparent to opaque, or otherwise difficult to measure. With the available choice of configurations, analytical options, objectives, and measurement modes, ContourX has been designed to meet the needs of virtually any challenging surface metrology application.
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ContourX-500
Bruker Nano Surfaces and MetrologyThe ContourX-500 Optical Profilometer is the world’s most comprehensive automated benchtop system for fast, non-contact 3D surface metrology. The gage-capable ContourX-500 boasts unmatched Z-axis resolution and accuracy, and is easily customized for the widest range of complex applications, from QA/QC metrology of precision machined surfaces and semiconductor processes to R&D characterization for ophthalmics and MEMS devices.