Advantages of measuring surface roughness with white light interferometry

The concept of measuring surface roughness originated nearly a century ago as a means to prevent uncertainty and disputes between manufacturers and buyers. Now, it has become a common identifier used throughout industry for validating manufacturing processes, confirming adherence to both internal and regulatory specifications, and guaranteeing quality and performance of end products. In this application note, Bruker Nano discusses the advantages of using mean roughness measurements with white light interferometry (WLI) optical profilers.