ZSX Primus II
Rigaku ZSX Primus II delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards. ZSX Primus II features an innovative optics-above configuration. Never again worry about a contaminated beam path or down time due to sample chamber maintenance. The optics-above geometry eliminates cleaning worries and increases…
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Great instrument!
Materials science
Easy to use. Highly reproducible results!
Review Date: 26 Oct 2020 | Rigaku Corporation
Great results!
Chemical analyses
The product offers high quality analyses for a variety of applications, such as pressed pellets, fused beads, loose powder and metals. It is easy to use and it obtains results quickly.
Review Date: 16 Mar 2020 | Rigaku Corporation
Rigaku ZSX Primus II delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.
ZSX Primus II features an innovative optics-above configuration. Never again worry about a contaminated beam path or down time due to sample chamber maintenance. The optics-above geometry eliminates cleaning worries and increases up time.
Providing superior performance with the flexibility for analyzing the most complex samples, the ZSX Primus II features a 30 micron tube, the thinnest end-window tube available in the industry, for exceptional light element (low-Z) detection limits. Combined with the most advanced mapping package to detect homogeneity and inclusions, the ZSX Primus II allows easy detailed investigation of samples that provide analytical insights not easily obtained by other analytical methodologies. Available multi-spot analysis also helps to eliminate sampling errors in inhomogeneous materials.
EZ-scan allows users to analyze unknown samples without any prior setup. This time saving feature requires only a few clicks of the mouse and a sample name to be entered.
ZSX Primus II Features
- Analysis of elements from Be to U
- Tube above optics minimizes contamination issues
- Small footprint uses less valuable lab space
- Micro analysis to analyze samples as small as 500 µm
- 30μ tube delivers superior light element performance
- Mapping feature for elemental topography/distribution
- Helium seal means the optics are always under vacuum
Silicate Rock Analysis by Fusion Method
Geochemical data set for silicate rocks are essential for modern petrology. Concentrations of major and trace component in igneous rock sample provide many kinds of information about rock history such as eruption or solidification, magma evolution, magma genesis and source materials as well as petrographical classification. This note demonstrates advanced methods, using the ZSX PrimusII from Rigaku, to determine the chemical composition in silicate rocks by XRF.
Sulfur Analysis in Crude Oil and High-Sulfur Fuels by WDXRF According to ASTM D2622-10
Sulfur compounds in petroleum cause various harmful influences such as air pollution, metal corrosion and catalyst degradation. Therefore, sulfur concentration of crude oil and high-sulfur fuels is monitored or controlled in refinery and production processes in the petroleum industry. This application note demonstrates quantitative analysis of high concentration sulfur in crude oil, high-sulfur diesel fuel and residual fuel oil according to ASTM D2622-10 on Rigaku ZSX Primus, a wavelength dispersive X-ray fluorescence (WDXRF) spectrometer.
Beryllium Analysis in Beryllium Copper Alloy
The characteristics and uses of beryllium copper alloys depend on beryllium concentration, thus it is important to analyze beryllium in beryllium copper. This application note demonstrates that beryllium in beryllium copper alloy can be routinely analyzed using the ZSX Primusll from Rigaku. The ZSX PrimusII, a tube-above sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, was equipped with a 4 kW X-ray tube with a Rh target, featuring a ultra-thin beryllium window, and four analyzing crystals covering F to U. In this analysis, the multi-layer analyzer, RX75 (optional) was also mounted in the spectrometer.
