Status:
ReviewerMember since: 2020
Organization: SRNL
Excellent cutomer service.
Application Area: Solids analysis
"Excellent cutomer service, the service engineer who installed instrument was excellent."
Maximize Your SEM Insights
Take advantage of achieving up to 30% better SEM resolution at low voltage.
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Profit from up to 40% faster material removal by the introduction of intelligent FIB milling strategies.
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Enjoy the benefits of integrated 3D EDS analysis.
Manufacturer ZEISS Research Microscopy Solutions | Available Worldwide
5.0 / 5.0 | 1 reviews