Rapid sample preparation for EBSD-analysis: Enabled by the LaserFIB

25 Feb 2021

State-of-the-art preparation methods are mechanical polishing with a vibration-polish finish for large areas or focused ion beam (FIB) polishing for smaller areas and sensitive materials.

In this application note, ZEISS demonstrate how to overcome the limitations of these methods by utilizing the new femtosecond laser for ZEISS Crossbeam, to rapidly prepare cross-sections in sheets of different metals and EBSD is performed on the laser-polished surfaces.

ZEISS Crossbeam Family

ZEISS Research Microscopy Solutions

Within ZEISS Crossbeam Family you have the choice between Crossbeam 340 or Crossbeam 550. Exploit the variable pressure capabilities of Crossbeam 340. Or use Crossbeam 550 for your most demanding characterizations and choose the chamber size, standard or large, that best suits your samples.

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Rapid sample preparation for EBSD-analysis: Enabled by the LaserFIB