ZEISS 3DSM
3D surface modelling.
Your scanning electron microscope measures and analyzes all kinds of samples in 2D: to analyze the surfaces of samples in 3D, use the system extension 3DSM. 3DSM, the computer-based application from ZEISS, provides you with topographical information by reconstructing a complete 3D model of the surface from SEM's AsB-Detector signals.
Three-Dimensional Surface Modelling (3DSM)
The 3D capabilities of scanning electron microscopes are still very limited, especially when it comes to qualitative surface characterization. This application note explores 3DSM applications, capable of providing topological information for samples imaged with Carl Zeiss Microscopy electron microscopes.
ZEISS Legacy Continues: Advancing Microscopy at M&M 2017
Peter Lander discusses the legacy and development of ZEISS microscopy and the importance of conferences such as M&M. Its collaboration with scientists has enabled ZEISS to provide instrumentation that satisfies their needs, with the aim to develop simplified software that enables complementary and overlaying analyses over a range of its instrumentation.





















