Ultra-high Resolution Scanning Electron Microscope S-5500 by Hitachi High-Technologies Corp (Microscopy)

5.0
/
5.0
  |  2 reviews
Extending the capabilities of the successful S-900 and S-5000 family of in-lense SEMs, the Hitachi S-5500 cold field emission scanning electron microscope sets a new standard for ultra-high resolution SEMs designed for today's nano- technology research and development. The S-5500 is unique in that it allows simultaneous secondary electron and backscattered electron imaging using an integrated detector design. The S-5500 permits 3-dimensional morphological observation down to the atomic or molecu... Read more


Ultra-high Resolution Scanning Electron Microscope S-5500 by Hitachi High-Technologies Corp (Microscopy) product image
Ultra-high Resolution Scanning Electron Microscope S-5500

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Average Rating: 5.0
2 Scientists have reviewed this product

5 out of 5
Ease of use
5 out of 5
After sales service
5 out of 5
Value for money


  • Status:

    Reviewer
  • Member since: 2019

  • Organization: Azire Integrated Healt Center



  • Ease of use
    5 out of 5
    After sales service
    5 out of 5
    Value for money
    5 out of 5
Great and quality view.
Rating: 5.0

  • Application Area: Microscopy

"For diagnostic purposes, high spatial resolution, capable of viewing high structural components of cells, organ and tissues. Have the following components: magnetic field, user interface, operating system, vibration, temperature, detectors, electron source, optics, vacuum system and stage, & upgradability."

Review date: 09 Apr 2019 | Ultra-high Resolution Scanning Electron Microscope S-5500
  • Status:

    Reviewer

  • Member since: 2011

  • Organization: Thermo Fisher



  • Ease of use
    5 out of 5
    After sales service
    5 out of 5
    Value for money
    5 out of 5
Rating: 5.0
"The world's highest resolution SEM!"

Review date: 31 May 2011 | Ultra-high Resolution Scanning Electron Microscope S-5500
Extending the capabilities of the successful S-900 and S-5000 family of in-lense SEMs, the Hitachi S-5500 cold field emission scanning electron microscope sets a new standard for ultra-high resolution SEMs designed for today's nano- technology research and development.

The S-5500 is unique in that it allows simultaneous secondary electron and backscattered electron imaging using an integrated detector design.
The S-5500 permits 3-dimensional morphological observation down to the atomic or molecular structures of various materials, far surpassing the performance of any conventional SEM.

A New BF/DF DUO-STEM Detector (Patent Pending) with variable collection angle adds a flexibility in signal capturing for imaging capability that gives the researcher a new dimension is signal control.