Ultra-high Resolution Scanning Electron Microscope S-5500
Extending the capabilities of the successful S-900 and S-5000 family of in-lense SEMs, the Hitachi S-5500 cold field emission scanning electron microscope sets a new standard for ultra-high resolution SEMs designed for today's nano- technology research and development. The S-5500 is unique in that it allows simultaneous secondary electron and backscattered electron imaging using an integrated detector design. The S-5500 permit…
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Great resolution
Inorganic surface analysis
The SEM was very easy to use and provided incredible resolution of the surface of my electrode.
Review Date: 3 Mar 2020 | Hitachi High-Technologies Corp (Microscopy)
Great and quality view.
Microscopy
For diagnostic purposes, high spatial resolution, capable of viewing high structural components of cells, organ and tissues. Have the following components: magnetic field, user interface, operating system, vibration, temperature, detectors, electron source, optics, vacuum system and stage, & upgradability.
Review Date: 9 Apr 2019 | Hitachi High-Technologies Corp (Microscopy)
The world's highest resolution SEM!
Review Date: 31 May 2011 | Hitachi High-Technologies Corp (Microscopy)
Extending the capabilities of the successful S-900 and S-5000 family of in-lense SEMs, the Hitachi S-5500 cold field emission scanning electron microscope sets a new standard for ultra-high resolution SEMs designed for today's nano- technology research and development.
The S-5500 is unique in that it allows simultaneous secondary electron and backscattered electron imaging using an integrated detector design.
The S-5500 permits 3-dimensional morphological observation down to the atomic or molecular structures of various materials, far surpassing the performance of any conventional SEM.
A New BF/DF DUO-STEM Detector (Patent Pending) with variable collection angle adds a flexibility in signal capturing for imaging capability that gives the researcher a new dimension is signal control.
