Park NX20 is an AFM platform for all Research Laboratories dealing with samples up to 200mm. From academic applications via Semiconductors and Failure Analysis, NX20 offers unique features such as accurate and reproducible measurements with decoupled XY scanning system, surface roughness measurements with Low Noise Z Detector, True Non-Contact™ Mode ensuring tip sharpness for surface roughness accuracy, wide range of high resolution scanning modes and modular design. NX20 is widely used the semiconductor and hard disk industry for its data accuracy and reproducible measurements improving productivity standards analytcial efficieny.
Key Technical Features:
Manufacturer Park Systems | Available Worldwide
Be the first to review this product