Park NX20 Atomic Force Microscope

The Park NX20 Atomic Force Microscope is an advanced research-grade AFM designed for high-resolution surface characterization and materials analysis. It builds on Park Systems’ non-contact AFM technology to deliver accurate topographical and material property measurements while minimizing tip wear and sample damage.

The NX20 is optimized for researchers who require greater flexibility and performance for complex nanoscale investigations. Its stable mechanical architecture and low-noise operation support reliable data acquisition across a wide range of sample types. The system supports multiple AFM imaging and measurement modes, enabling detailed analysis of surface structure and material properties.

With its balance of performance, versatility, and ease of use, the NX20 is well suited for multidisciplinary research environments and advanced materials science applications.

Key Features:

• Non-contact AFM technology for accurate, low-damage measurements
• High mechanical stability for high-resolution imaging
• Support for advanced imaging and analysis modes
• Flexible platform for complex research applications