Park FX40 AFM
Automated AFM for fast, accurate nanoscale imaging
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Great results published many articles. Value for money.
Material samples
Value for money, used by all the students, great sturdiness.
Review Date: 23 Jul 2021 | Park Systems
Easy instrument and great results.
Material samples
Value for money, highly user friendly and used by all the students. Great experience for the students to learn on sophisticated instruments.
Review Date: 23 Jul 2021 | Park Systems
The Park FX40 Atomic Force Microscope is a high-performance AFM designed for researchers who require reliable, high-resolution nanoscale imaging with fast throughput. Built on Park Systems’ non-contact AFM technology, the FX40 delivers accurate topographical and material property measurements while minimizing tip and sample damage.
The system supports a wide range of AFM modes, enabling detailed surface characterization across diverse materials. Its rigid mechanical design and advanced vibration isolation ensure stable imaging performance, even for challenging samples. The FX40 is well suited for both routine measurements and advanced research applications in materials science, nanotechnology, and semiconductor research.
Key Features:
- Non-contact AFM technology for accurate measurements
- High mechanical stability for repeatable imaging
- Broad support for imaging and property-mapping modes
- User-friendly software for efficient operation
Introducing the Park FX40 atomic force microscope from Park Systems
This application note demonstrates the design, ease of operation, and imaging capabilities of the new Park FX40 from Park Systems. The automatic AFM system is designed to acquire high-quality images quickly, using novel features such as machine learning and pattern recognition, QR-code based tip selection, and fully automatic tip exchange and alignment.
A new class of atomic force microscope: FX40, the automatic AFM
This technical note demonstrates the innovative design, ease of operation, and superior imaging capabilities of the new Park FX40. This automatic Atomic Force Microscope (AFM) system is designed to acquire high-quality images fast, using novel features such as machine learning and pattern recognition, QR-code based tip selection, and fully automatic tip exchange and alignment. This technical note describes the imaging process from beginning to end and illustrates it with real-world application examples.
A groundbreaking new class of atomic force microscope
In this video, meet the Park FX40, a groundbreaking autonomous atomic force microscope, infused with innovative robotics, intelligent learning features, safety features, software, and specialized add-ons.
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Park Systems announces Park FX40, the autonomous AFM with built-in intelligence
The new AFM offers an overhaul in functionality while retaining the same basic design elements
