N-SIM Super-Resolution by Nikon Instruments Europe

Nikon’s new N-SIM microscopy system can produce two times the resolution of conventional optical microscopes by combining Structured Illumination Microscopy technology licensed from UCSF and based on the world renowned Eclipse Ti research inverted microscope with Nikon’s legendary CFI Apo TIRF 100x oil objective lens (N.A. 1.49), developed using unique optical technologies and manufacturing techniques. N-SIM also delivers the fastest imaging capability in the industry, with a time resolution of ... Read more


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N-SIM Super-Resolution

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Nikon’s new N-SIM microscopy system can produce two times the resolution of conventional optical microscopes by combining Structured Illumination Microscopy technology licensed from UCSF and based on the world renowned Eclipse Ti research inverted microscope with Nikon’s legendary CFI Apo TIRF 100x oil objective lens (N.A. 1.49), developed using unique optical technologies and manufacturing techniques. N-SIM also delivers the fastest imaging capability in the industry, with a time resolution of 0.6 sec/frame.

The newly developed TIRF-SIM illumination technique enables Total Internal Reflection Fluorescence (TIRF) observation with higher resolution than conventional TIRF microscopes and gives more detailed structural information near the cell membrane.