inVia InSpect confocal Raman microscope
Confocal Raman microscope optimised for use in forensic laboratories for trace analysis
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Extremely satisfied with performance and ease of use
Analysis, identification of materials, phase distributions
Awesome and easy to use. Great add on accessories make it a multiplied its impact for our organization. Training is very helpful and automation makes it the go to tool for many materials science applications.
Review Date: 27 May 2022 | Renishaw plc.
Identify materials that may be difficult or time consuming with other techniques such as hard crystalline powders, ceramic shards and glass chips, easily analysed with little or no preparation required.
Your inVia InSpect will give you:
- High spatial resolution - comparable to your other microscopic techniques
- A range of microscope contrast techniques - including brightfield, darkfield and polarisation contrast with reflected and transmitted light illumination
- High-performance video camera and long working distance objectives - locate points and areas of interest even on complex substrates
- High-precision motorised stage - essential for analysing microscopic particles
- Dual laser wavelengths - easily switch between wavelengths at the click of a button and analyse the same point on your sample
- Automated alignment - with inbuilt calibration checks
- Particle analysis - use advanced image recognition algorithms and instrument control features to characterise particle distributions
- Correlative imaging - create composite images by combining Raman data with images from other microscopy techniques
Brochures
Trace analysis using the inVia InSpect confocal Raman microscope
Raman spectroscopy is a non-contact, typically non-destructive analytical technique, meaning that samples can be reanalysed multiple times without damage or contamination. This product brochure from Renishaw details the features of the inVia™ InSpect, a new version of its bestselling inVia confocal Raman microscope, optimized for use in forensic laboratories for trace evidence analysis.
Renishaw introduces breakthrough time-resolved Raman spectroscopy integration
TRRS leverages the faster interaction time of Raman scattering to distinguish the Raman signal from the fluorescence background
Renishaw launches raman system for forensic analysis
The latest inVia InSpect confocal microscope has been optimized for forensic trace analysis and promises greater capabilities
