UltimaIV
The Ultima IV represents the state-of-the-art in multipurpose X-ray diffraction (XRD) systems. Incorporating Rigaku's patented cross beam optics (CBO) technology for permanently mounted, permanently aligned and user-selectable parallel and focusing geometries, the Ultima IV X-ray diffractometer can perform many different measurements fast.With a multipurpose diffractometer, performance is measured by not only how fast you per…
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Only such a diffractometer is needed to solve our scientific problems
Phase and crystal structure analysis of polycrystalline samples
Automatic alignment, high speed, high resolution. We have problems with this device, service is no good. Very expensive.
Review Date: 15 Dec 2021 | Rigaku Corporation
This is a basic and very necessary instrument in academia.
Material characterization
Very sophistic instrument, a little hard to handle one has to learn. After-sales service is good. It is a value for money product.
Review Date: 2 Feb 2021 | Rigaku Corporation
The Ultima IV represents the state-of-the-art in multipurpose X-ray diffraction (XRD) systems.
Incorporating Rigaku's patented cross beam optics (CBO) technology for permanently mounted, permanently aligned and user-selectable parallel and focusing geometries, the Ultima IV X-ray diffractometer can perform many different measurements fast.
With a multipurpose diffractometer, performance is measured by not only how fast you perform an experiment but also how fast you can switch between different types of experiments. Individual experiments are optimized with accessories like the D/teX Ultra high-speed position sensitive detector system, but the speed between experiments is radically improved with the combination of the automated alignment and CBO.
The Ultima IV is the only XRD system on the market today that incorporates fully automatic alignment. When coupled with CBO and the in-plane arm, the automatic alignment capability makes the Ultima IV X-ray diffractometer the most flexible system available for multipurpose applications.
UltimaIV Features:
- Full automated alignment under computer control.
- Optional in-plane diffraction arm for in-plane measurements without reconfiguration.
- Focusing and parallel beam geometries without reconfiguration.
SAXS capabilities. - Optional D/teX Ultra high-speed, position-sensitive detector system.
Quantification of Trace Crystal Polymorph Components using a High-speed 1-Dimensional Detector
Materials with the same chemical formula but different crystal structures are called polymorphs. Since an X-ray diffraction profile depends on the crystal structure of the measured materials, XRD is used to evaluate crystal polymorphs. In this application note, a trace component of anatase, a commercially sold reagent, was evaluated with a standard addition method by using a high-speed 1-dimensional detector.
Particle Diameter Distribution of Subnano Gold Particles using the Small-Angle X-ray Scattering Method
By using the small-angle x-ray scattering method, it is possible to evaluate the size distribution of powders, microparticles dispersed in liquid, and particles/pores distributed in thin films. In particular, it is possible to evaluate the average size and distribution of sub-nanometer particles, which are difficult to evaluate with a TEM or DLS. In this application note, the size distribution of gold nanoparticles in organic solvent was evaluated.
