ZEISS Research Microscopy Solutions Products

Field Emission-SEM for advanced analytical microscopy The SIGMA series of Field Emission Scanning Electron Microscopes (FE-SEM) delivers advanced analytical microscopy with the high performance you expect from Carl Zeiss. Equipped with ... Read more...

Within ZEISS Crossbeam Family you have the choice between Crossbeam 340 or Crossbeam 550. Exploit the variable pressure capabilities of Crossbeam 340. Or use Crossbeam 550 for your most demanding characterizations and choose the chamber si... Read more...

Your Microscope for Research and Routine in the Materials Lab Read more...

Examine Large Specimens - Automated and Compatible with Clean Rooms. Read more...

EVO 18 provides excellent quality imaging results from an analytical microscope with the capability to handle all material types EVO 18 offers Energy and Wavelength Dispersive Spectroscopy (EDS & WDS) ports as standard. A fully int... Read more...

Your manual routine microscope for materials. Read more...

Your software solution for SEM, FE-SEM and FIB-SEM. Read more...

Sampling Made Simple: Your Automated Digital Microscope for Routine And Failure Analyses. Read more...

Digital image processing for widefield microscopy Whether you are a beginner in digital microscopy or an imaging expert, AxioVision will guide you to reproducible results with the aid of structured workflows. With our digital image ... Read more...

From Imaging to Your Complete Lab: Analytical Power for the Sub-Nanometer World. Read more...

For Your Highest Demands in Sub-nanometer Imaging, Analytics and Sample Flexibility Read more...

Smart. Precise. Open. Imaging Software Simplified. Read more...

Run ZEN 2 core for free Read more...

Advanced Image Processing across Multiple Microscopy Methods Read more...

Your X-ray System for Today with Assurance for Tomorrow. Read more...

Versatile Confocal Microscope for Advanced Imaging and Surface Topography   Read more...

Confocal Laser Scanning Electron Microscope for fast and gentle multiplex imaging, optimized for simultaneous spectral detection of multiple weak labels with highest light efficiency. Read more...

3D surface modelling. Read more...

Large area imaging for SEM, FE-SEM & FIB-SEM ATLAS combines a 16 bit scan generator and dual super-sampling signal acquisition hardware with image processing and control software for your ZEISS electron microscope. Acquire images up ... Read more...

Three Ion Beams for Total Flexibility in Sub-10 nm Fabrication. Read more...

Your Interactive SEM for Multi-User Environments Read more...

Your Field Emission SEMs for High Quality Imaging and Advanced Analytical Microscopy. Read more...

Analyze non-metallic inclusions in conformity with standards. Read more...

Bridge the Micro and Nano World in Materials Inspection and Analysis. Read more...

Your Multi-talented Stand from Carl Zeiss. Read more...