Scanning Electron Microscopes (SEM)

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Ultra-high Resolution Scanning Electron Microscope S-5500

(3)

Hitachi High-Technologies Corp (Microscopy)



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SU8000 Series UHR Cold-Emission FE-SEM

(2)

Hitachi High Technologies America, Inc.



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SU8200 Series CFE SEM

(1)

Hitachi High Technologies America, Inc.



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SU3500 Premium VP-SEM

(1)

Hitachi High Technologies America, Inc.



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TM3030

(1)

Hitachi High Technologies America, Inc.



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IT500 InTouchScope SEM Series

(6)

JEOL USA



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S-3400N Fully Automated VP SEM

(2)

Hitachi High Technologies America, Inc.



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JSM-7900F

(3)

JEOL USA



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OmniProbe 400

(1)

Oxford Instruments NanoAnalysis



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JSM-7610FPlus

(3)

JEOL USA



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JXA-8530F

(1)

JEOL USA



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Thermo Scientific™ Talos™ Arctica™ TEM for Life Sciences

(1)

Thermo Fisher Scientific



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SU6600 Analytical VP FE-SEM

(1)

Hitachi High Technologies America, Inc.



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JAMP-9510F

JEOL USA



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JSM-IT200

JEOL USA



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JSM-IT800 series

JEOL USA



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JSM-IT500

JEOL USA



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JSM-IT700HR

JEOL USA



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JCM-7000 NeoScope Benchtop SEM

JEOL USA



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S-3700N Ultra Large VP-SEM

Hitachi High Technologies America, Inc.