Scanning Electron Microscopes (SEM)

The World's Fastest Scanning Electron Microscopes. Read more...

Extending the capabilities of the successful S-900 and S-5000 family of in-lense SEMs, the Hitachi S-5500 cold field emission scanning electron microscope sets a new standard for ultra-high resolution SEMs designed for today's nano- techno... Read more...

The SU8000 Series is Hitachi's latest product family of ultra-high performance, semi-in-lens SEM with cold-field emission. The series was developed in response to the growing demand for robust, affordable SEM application solutions. Im... Read more...

The most versatile high-performance SEM. Read more...

Ultra-high Resolution Scanning Electron Microscope SU8200 Series - Innovative Cold Field Emission Gun with Unmatched Resolution and Beam Stability This novel CFE gun employs a Hitachi patented "Mild flashing" technique and a new vacuum... Read more...

The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive logic, the new user-friendly GUI provides compreh... Read more...

The TM3030/TM3030Plus are equipped with premium signal detectors which have been incorporated in FE-SEM and VP-SEM and provide unparalleled image quality.   Read more...

Versatile Research Grade SEM Read more...

The S-3400N is the World Class Variable Pressure SEM The S-3400N offers advances in automation including full filament saturation and “no touch” objective aperture alignment. The New Analytical Chamber Provides • Segment, Ultra... Read more...

JSM-7900F is JEOL’s flagship FE-SEM which combines extreme high-resolution imaging, enhanced stability, and exceptional ease of use for any level of operator in a multi-purpose environment. Read more...

A ninth generation nanomanipulator, designed for optimum performance and flexibility. Read more...

Thermal, Analytical Field Emission SEM Read more...

Since the 1960s, JEOL EPMA systems have been the leading microprobes used in high accuracy qualitative and quantitative in-depth surface analysis as well as area analysis. JEOL EPMA systems have evolved to enhance the user experience... Read more...

The Thermo Scientific™ Talos™ Arctica™ is a 200kV FEG transmission and scanning electron microscope (S/TEM). It is a powerful, stable, and versatile system for delivering high-resolution 3D characterization of biological... Read more...

The SU6600 is Hitachi's latest high resolution analytical field emission SEM with Variable Pressure technology allowing observation and analysis of any type of wet, oily or dirty sample. Advanced Schottky electron gun technology combined w... Read more...

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Field Emission Auger Microprobe Read more...

Scanning Electron Microscope Read more...

Field Emission Scanning Electron Microscope Read more...

Field Emission EPMA Read more...

LaB6 EPMA Read more...

Scanning Electron Microscope Read more...

Scanning Electron Microscope with exceptional fidelity at any kV Read more...

This 4th generation Neoscope incorporates advanced technology and functions that make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in minutes.  It is equipped with a large cha... Read more...

The S-3700N features an ultra large specimen chamber and stage to allow observation of specimens at diameters up to 300mm. Hitachi Variable Pressure SEM (VP-SEM) series have been received with high reputation from customers around the wo... Read more...