Electron Microscopy

Electron microscopy is a powerful technique which uses an accelerated beam of electrons for sample imaging. Types of electron microscopy include transmission electron microscopy (TEM) and scanning electron microscopy (SEM) which includes FESEM and STEM. Electron microscopes have specific magnification and resolution. The type of EM determines the sample preparation and detectors required.  

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8500 Field Emission Scanning Electron Microscope (FE-SEM)

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Agilent Technologies



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ZEISS SIGMA VP

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ZEISS Research Microscopy Solutions



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ZEISS EVO 18 SEM

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ZEISS SmartSEM

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ZEISS GeminiSEM for Materials

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ZEISS SIGMA FAMILY

ZEISS Research Microscopy Solutions



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ZEISS Crossbeam Family

ZEISS Research Microscopy Solutions



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ZEISS GeminiSEM Family

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ZEISS EVO HD

ZEISS Research Microscopy Solutions



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ZEISS ORION NanoFab

ZEISS Research Microscopy Solutions



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ZEISS Shuttle & Find for Material Analysis

ZEISS Research Microscopy Solutions



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ZEISS Atlas 5

ZEISS Research Microscopy Solutions



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MicOS Microscope Optical Spectrometer

HORIBA Scientific



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CLUE Series Cathodoluminescence Add-ons for Electron Microscopes

HORIBA Scientific



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RISE Microscopy - Correlative Raman Imaging and Scanning Electron Microscopy (Raman-SEM)

WITec GmbH



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Particle Characterisation Service

LGC



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ZEISS GeminiSEM for Life Sciences

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ZEISS EVO Family

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ZEISS ZEMAS

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sciTEM for Material Sciences

Scienion



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PIPS II System

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Gatan Inc.



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3View System

Gatan Inc.