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chieving high quality cross-sections of almost any material, revealing the internal structures of the sample with scarcely any deformation or damage was never before more convenient than now, using the Leica EM TIC 3X. The Triple Ion Bea... Read more...
Precision ion polishing system for precise centering, control, and reproducibility of your milling process. Read more...
Ideal for low energy surface preparation for your SEM cross section viewing. Read more...
Enables fast, clean, and efficient preparation of samples for microstructure characterization and failure analysis. Read more...
The Hitachi IM4000 Ar Ion Milling System offers two milling configurations available in a single instrument: cross section cutting and wide-area sample surface fine polishing. The new Ar ion gun design, with increased milling rate (300... Read more...
Revolutionary ultra-low-energy, concentrated ion beam Fischione’s Model 1040 NanoMill® TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscop... Read more...
High-quality thin foils for TEM Electrolytic thinning of conductive materials is an effective method of quickly producing specimens for transmission electron microscopy (TEM) without any induced artifacts. In the Model 110 Twin-Jet Elec... Read more...