AFM / STM

Atomic force microscopes (AFM) and scanning tunneling microscopes (STM) are high-resolution forms of scanning probe microscope (SPM) used to generate topological information of a sample down to the atomic scale. Instruments can generate an image of the surface topology, manipulate objects and reveal information on localized properties such as Young’s modulus, conductivity, and magnetism. High-quality STM and AFM probes optimized for your application are available, as well as other SPM-based instruments such as scanning ion conductance microscopes (SICM) & near-field scanning optical microscopes (NSOM). Find the best AFM and STM equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.

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Showing 1 - 25 of 80 results

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Park NX10 AFM

(2)

Park Systems



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Park NX-Hivac

Park Systems



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Park NX12

Park Systems



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Park XE7

Park Systems



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Dimension FastScan™

(1)

Bruker-Nano



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Dimension Icon Atomic Force Microscope

(4)

Bruker-Nano



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Cypher™ AFM

(4)

Asylum Research



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alpha300 RA Correlative Raman-AFM Microscope

(12)

WITec GmbH



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Scanning Probe Microscope Series WITec alpha300

(1)

WITec GmbH



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BioScope Catalyst™ BioAFM

(1)

Bruker



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MFP-3D-BIO™

(1)

Asylum Research



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MultiMode 8-HR

(3)

Bruker-Nano



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MFP-3D™ Stand Alone AFM

(4)

Asylum Research



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Innova-IRIS

(1)

Bruker-Nano



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alpha300 S Scanning Near-field Optical Microscope

(1)

WITec GmbH



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Dimension Edge™ AFM platform

(1)

Bruker-Nano



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alpha300 access

(1)

WITec GmbH



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alpha300 A Atomic Force Microscope

WITec GmbH



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PeakForce QNM

Bruker-Nano



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NanoRacer® High-Speed AFM

Bruker



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MFP-3D-CF™ AFM

Asylum Research



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attoMFM I

Attocube Sytems, AG



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attoSHPM

Attocube Sytems, AG



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attoFPSensor

Attocube Sytems, AG



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attoAFMsolutions

Attocube Sytems, AG