AFM / STM

Atomic force microscopes (AFM) and scanning tunneling microscopes (STM) are high-resolution forms of scanning probe microscope (SPM) used to generate topological information of a sample down to the atomic scale. Instruments can generate an image of the surface topology, manipulate objects and reveal information on localized properties such as Young’s modulus, conductivity, and magnetism. High-quality STM and AFM probes optimized for your application are available, as well as other SPM-based instruments such as scanning ion conductance microscopes (SICM) & near-field scanning optical microscopes (NSOM). Find the best AFM and STM equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.

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WITec GmbH (5)

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Showing 1 - 25 of 76 results

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alpha300 RA Correlative Raman-AFM Microscope

(8)

WITec GmbH



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Scanning Probe Microscope Series WITec alpha300

(1)

WITec GmbH



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alpha300 S Scanning Near-field Optical Microscope

(1)

WITec GmbH



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alpha300 access

(1)

WITec GmbH



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alpha300 A Atomic Force Microscope

WITec GmbH



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Park NX10

Park Systems



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Park NX20

Park Systems



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Park NX-Hivac

Park Systems



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Park NX12

Park Systems



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Park XE7

Park Systems



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Park NX20 300mm

Park Systems



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Park NX-Wafer

Park Systems



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Park NX-3DM

Park Systems



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Park NX-PTR

Park Systems



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Park NX-HDM

Park Systems



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Tosca Series

Anton Paar GmbH



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Cypher ES Polymer Edition AFM

Oxford Instruments America Inc.



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Dimension Icon Atomic Force Microscope

(2)

Bruker-Nano



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MultiMode 8-HR

(2)

Bruker-Nano



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Innova-IRIS

(1)

Bruker-Nano



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Dimension Edge™ AFM platform

(1)

Bruker-Nano



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Dimension FastScan™

Bruker-Nano



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PeakForce QNM

Bruker-Nano



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BioScope Catalyst™ BioAFM

Bruker



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Cypher™ AFM

(1)

Asylum Research