Electron Microscopy > Scanning Electron Microscopes (SEM) Products & Reviews

For the Highest Demands in Imaging and Analytics from Any Sample

The tabletop microscope for quick and easy SEM imaging and elemental analysis

The S-3400N is the World Class Variable Pressure SEM The S-3400N offers advances in automation including full filament saturation and “no touch” objective aperture alignment. The New Analytical Chamber Provides • Segment, Ultra Thin, Backscattered Electron Detector Capable of TV Rate Observation • Fully Automated with One Button Automatic "No Touch" Objective Aperture Alignment • Turbo Molecular Pump (TMP) Provides a Fast and…

The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive logic, the new user-friendly GUI provides comprehensive image observation and display functions. Engineered for a wide range of applications, including biological specimens and advanced materials, the SU3500 is sure to be the workhorse micros…

The SU8000 Series is Hitachi's latest product family of ultra-high performance, semi-in-lens SEM with cold-field emission. The series was developed in response to the growing demand for robust, affordable SEM application solutions. Image performance in this series is optimized with the latest generation of Hitachi's patented super ExB in-lens detection for energy filtering, charge suppression, and contrast control; affording u…

Ultra-high Resolution Scanning Electron Microscope SU8200 Series - Innovative Cold Field Emission Gun with Unmatched Resolution and Beam Stability This novel CFE gun employs a Hitachi patented "Mild flashing" technique and a new vacuum system which greatly minimizes gas molecule deposition on the emitter tip. The emitter always operates in a "clean" state, and emission current and beam stability are significantly improved. The…

A fully PC controlled SEM with conventional tungsten heated cathode intended both for high vacuum as well as for low vacuum operations. Outstanding optical properties, flicker-free digital image with super clarity, sophisticated user-friendly software for microscope control and image capturing using Windows™ platform, standard formats of stored images, easy image management, processing and measurements, automatic setup of the…

MIRA3 AMU is a high performance FE-SEM system equipped with an extraordinarily large chamber. This unique microscope allows the imaging and analysis of extraordinary large samples that cannot be fitted in standard chambers.

The most versatile high-performance SEM.

Ultra-versatile high-resolution SEM with unique environmental capability

Large area image acquisition

The TM3030/TM3030Plus are equipped with premium signal detectors which have been incorporated in FE-SEM and VP-SEM and provide unparalleled image quality.  

OmniProbe 400 is a ninth-generation FIB-SEM nanomanipulator designed for precise, flexible nanoscale manipulation and high-throughput workflows.

Your Interactive SEM for Multi-User Environments

For Your Highest Demands in Sub-nanometer Imaging, Analytics and Sample Flexibility

The Only Integrated SEM/EDX System Now in its third generation, the ASPEX EXplorer is a scanning electron microscope that is designed for the automated imaging and elemental analysis of a wide spectrum of surfaces and particulate. A unique blend of hardware ruggedization and software sophistication creates a system platform that is readily accessible. The ASPEX EXplorer system provides a fully integrated SEM and EDX platform f…

The SU6600 is Hitachi's latest high resolution analytical field emission SEM with Variable Pressure technology allowing observation and analysis of any type of wet, oily or dirty sample. Advanced Schottky electron gun technology combined with our patented ADAPT, automated differential aperture system, yields greater than 200nA of current; ten times the current other manufacturers can provide with thermal emissions. The large a…

This new generation of MIRA field emission scanning electron microscopes provides users with the advantages of the latest technology, such as new improved high-performance electronics for faster image acquisition, an ultra-fast scanning system with compensation for static and dynamic image aberrations or built-in scripting for user-defined applications, all the while maintaining the best price to performance ratio. The MIRA…

The Thermo Scientific™ Talos™ Arctica™ is a 200kV FEG transmission and scanning electron microscope (S/TEM). It is a powerful, stable, and versatile system for delivering high-resolution 3D characterization of biological and biomaterials samples in cell biology, structural biology, and nanotechnology research. 

This device is dedicated to precious metal thin film coating for SEM observation.

SEM EDS instrument that is flexible, easy to use, and offers instantaneous, quantitative elemental analysis.

Scanning nitrogen-vacancy magnetometry

Desktop SEM with increased chamber size for large samples up to 100 mm x 100 mm.

FE-SEM for high-quality imaging & advanced analytical microscopy