ZEISS GeminiSEM Family​

Materials science is crucial in shaping our world and driving innovation across various fields like aerospace, construction, and medicine. It involves understanding the behavior of materials such as alloys, ceramics, composites, and polymers throughout their lifecycle. This knowledge is essential for optimizing their properties for specific applications.

Download this expert guide for free today and explore advanced microscopy solutions from ZEISS, including 3D non-destructive high-resolution X-ray microscopes and scanning electron microscopes (SEM). The eBook also covers analytical techniques such as Electron Channelling Contrast Imaging (ECCI) and Electron Backscattered Diffraction (EBSD).

Plus, find case studies on polycrystalline materials, metals, alloys, fiber composites, and multiscale samples, and learn about the tools essential for modern materials science analysis.

In this application note, Zeiss discusses ultra-low voltage imaging in field emission scanning microscopes. Learn how imaging is performed and how beam damage and charging are avoided. The advantages are illustrated on various materials like polymers, batteries etc.

In the last 20 years, a major thrust of research in scanning electron microscopy (SEM) has been driving the performance of systems towards higher resolution at lower voltages. Key to the performance of any SEM, conventional or field emission SEM (FE-SEM), is its electron optical column.

In this application note, ZEISS demonstrate the evolution of their FE-SEMs, which are based upon the Gemini column design which has seen a number of technological advancements since it was first launched in 1993. The latest development in this field is the new engine Smart Autopilot which provides further increases in resolution at low kV by optimizing the convergence angle of
electrons travelling through the column at given conditions.

Field emission scanning electron microscopy is standard technology for high resolution imaging and different contrasting methods aiming for a comprehensive characterization of specimens. A wide range of applications is covered by classical FE-SEM technology, including imaging surface sensitive and non-conductive samples without pre-treatment. This application note demonstrates the utility of Zeiss' Gemini technology in advanced imaging applications.

High-resolution combined with an additional expansion of analytical capabilities is extremely important for many applications in material analysis. With the integration of a charge compensation system, these investigations are not restricted to conductive samples only but can also be executed for all kinds of non-conductive samples. Such a method is demonstrated here in the application note below.

In this poster, ZEISS demonstrates the capacity of Gemini Optics with a variety of real-world samples, ranging from metal particles to biological materials.

ZEISS Microscopy offers multi-modal characterizations and advanced analysis options for industry and research. This application note provides a variety of applications of ZEISS products to analyze steel and other metals.

ZEISS in situ AFM optics integrates the best qualities of AFM and SEM to deliver high-performance in visualizing 3D topography down to the atomic level while measuring a wide range of physical properties. To find out more about the applications of in situ AFM, check out the appnote below.

The GeminiSEM serie stands for effortless imaging with sub-nanometer resolution and high detection efficiency. You can rely on its surface sensitive analysis and profit from the highest sample flexibility. The appnote below provides essential guidances to choose the best GeminiSEM product for your research, industrial lab, imaging facility or educational organization.

This application note explores the capabilities of the GEMINI II column found in the ZEISS MERLIN FE SEM, including: short image acquisition times at high resolution for mosaics, 3D data collection and fast mapping for chemical analysis (EDS) and crystallography studies (EBSD) over a wide range of materials and applications.

April 29, 2025 - 09:00 BST / 10:00 CEST / 16:00 CST / 17:00 JST

Join us for an informative webinar sponsored by ZEISS, where we will introduce ZEN core, a sophisticated software solution designed to enhance your microscopy workflows. This session will focus on how ZEN core provides a streamlined user interface that accommodates both light and electron microscopy, allowing users to transition seamlessly between modalities.

During the session, you will discover how ZEN core's intuitive user interface adapts to the unique needs of your laboratory allowing users of all experience levels to efficiently image, analyze, and manage data. We will explore the advanced imaging capabilities, automated workflows, and powerful AI features that make ZEN core the command center for both light and electron microscopes.

Join us for a live demonstration of ZEN core and take part in our Q&A session to address your specific inquiries. Register today to learn how ZEN core can support your microscopy research and analysis needs.

Key learning objectives:

• Understand how ZEN core fosters seamless collaboration in connected laboratory environments
• Explore the integration of multiple microscopy techniques within a unified platform
• Learn how ZEN core ensures data consistency and standardization across instruments and locations

Who should attend?

This webinar is ideal for researchers in both academia and industry looking to improve their microscopy practices and enhance productivity.

Certificate of attendance

All webinar participants can request a certificate of attendance, including a learning outcomes summary, for continuing education purposes.

If you view the on-demand webinar, you can request a certificate of attendance by emailing editor@selectscience.net.

In this introductory video, Dr. Alexander Thesen, product manager at ZEISS, describes the advantages of the ZEISS GeminiSEM Family.

In this video, learn how ZEISS is developing technologies for use at the cutting edge of science, consumer electronics, energy, construction, and more.

In this webinar, find out how machine learning software, ZEISS ZEN Intellesis, can be applied to speed up and advance image processing capabilities across multiple microscopy methods. Tim Schubert (University Aalen) and Tobias Volkenandt (ZEISS Microscopy) present their latest application examples concerning image analysis and segmentation using machine learning techniques, revealing its excellent application for materials analysis via SEM, FIB-SEM, light microscopy and X-ray microscopy.

ZEISS Microscopy is partnering with WITec to enhance their advanced scanning electron microscope (SEM) with the addition of Raman technology. In this video, discover how this partnership has enabled the combination of high resolution techniques to create an integrated system which can be used with ease.

In this video, Dr. Richard Johnston explains how he uses ZEISS microscopy to investigate the internal structures of both human-made and natural products. The use of non-destructive testing within his research enables the interrogation of microstructures and loading of materials, with the aim of applying the microstructure form and function to engineering and design. Johnston explains how advances and collaborations with ZEISS microscopy are enabling correlative imaging studies.

Watch this on-demand webinar to find out how the Gemini technology from ZEISS addresses challenging microscopy samples

Watch this webinar to gain insight into SIMS technology and discover an innovative solution offering the world record in SIMS lateral resolution

High-resolution 3D block face imaging for biological samples with fast acquisition rates and minimal sample damage

From news to application articles, discover the latest advances and methodologies in materials and energy research

High-resolution 3D block face imaging for biological samples with fast acquisition rates and minimal sample damage

Visit Booth #1852 to see ZEISS Microscopy products for use in life science research and material analysis

SelectScience® spoke to Thomas Deerinck, National Center for Microscopy and Imaging Research at University of California, San Diego, about how correlative microscopy is helping scientists understand disease states