ZEISS EVO Family

Understanding veterinary pathologies enables better conservation. This case study describes the analysis of python blood using cells prepared conventionally for electron microscopy, and thin sections subsequently imaged using an EVO15 HD SEM (scanning electron microscope) fitted with a transmission electron microscope (STEM) attachment.

ZEISS Microscopy offers multi-modal characterizations and advanced analysis options for industry and research. This application note provides a variety of applications of ZEISS products to analyze steel and other metals.

Correlative light and electron microscopy (CLEM) combines the overview information of fluorescence light microscopy (FLM) with structural details in scanning electron microscope (SEM) for high-content imaging. Hence, CLEM is very useful for investigating infection and colonization of the legume hosts by their rhizobial symbionts. This white paper illustrates a methodology involving the shuttle & find interface of CLEM to enable fast and reliable analysis of the bacterial infection of legume root nodule cells.

Throughput of the scanning electron microscope can be limited by the need to find small features on a large specimen. This application note showcases the capabilities of the Stubscope for navigation assistance in SEM.

EVO conventional scanning electron microscope has a new sample bias module that enables beam deceleration imaging. This, combined with the ZEISS HD BSE detector, produces high quality images with enhanced surface contrast and topographical detail.

The combination of microscopic and quantitative micro-structural analysis is a powerful method of obtaining information on geometry, usage properties and wear conditions of tools. The mechanical and usage properties of hard metal tools are crucially affected by their microstructure; therefore microscopic investigation of the micro- and macro-structure of the tools is a powerful and fast technique for checking the quality and corresponding usage properties of tools such as drills. This application notes presents possible applications of different microscopy systems from optical light to electron microscopy.

April 29, 2025 - 09:00 BST / 10:00 CEST / 16:00 CST / 17:00 JST

Join us for an informative webinar sponsored by ZEISS, where we will introduce ZEN core, a sophisticated software solution designed to enhance your microscopy workflows. This session will focus on how ZEN core provides a streamlined user interface that accommodates both light and electron microscopy, allowing users to transition seamlessly between modalities.

During the session, you will discover how ZEN core's intuitive user interface adapts to the unique needs of your laboratory allowing users of all experience levels to efficiently image, analyze, and manage data. We will explore the advanced imaging capabilities, automated workflows, and powerful AI features that make ZEN core the command center for both light and electron microscopes.

Join us for a live demonstration of ZEN core and take part in our Q&A session to address your specific inquiries. Register today to learn how ZEN core can support your microscopy research and analysis needs.

Key learning objectives:

• Understand how ZEN core fosters seamless collaboration in connected laboratory environments
• Explore the integration of multiple microscopy techniques within a unified platform
• Learn how ZEN core ensures data consistency and standardization across instruments and locations

Who should attend?

This webinar is ideal for researchers in both academia and industry looking to improve their microscopy practices and enhance productivity.

Certificate of attendance

All webinar participants can request a certificate of attendance, including a learning outcomes summary, for continuing education purposes.

If you view the on-demand webinar, you can request a certificate of attendance by emailing editor@selectscience.net.

In this video, learn how ZEISS is developing technologies for use at the cutting edge of science, consumer electronics, energy, construction, and more.

Cut your samples with an integrated ultramicrotome, slice them with a focused ion beam (FIB) gun, or image nondestructively with X-ray. Get a maximum of information from your samples in 3D and correlate with light microscopy. Experience the largest portfolio of 3D imaging for light, electron and X-ray microscopy in this video from ZEISS Microscopy.

Modular platform for intuitive operation, routine investigations and research applications

Providing analytical microscopes for NASCAR Engine Producer