Symmetry® S2 by Oxford Instruments NanoAnalysis

Manufacturer Oxford Instruments NanoAnalysis  |  Available Worldwide
4.7
/
5.0
  |  1 reviews
Symmetry S2 is the only genuine all-in-one EBSD detector on the market, allowing thorough characterisation of the nanostructures of crystalline materials.


Symmetry® S2 by Oxford Instruments NanoAnalysis product image
Symmetry® S2

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Average Rating: 4.7
1 Scientist has reviewed this product

5 out of 5
Ease of use
4 out of 5
After sales service
5 out of 5
Value for money


  • Status:

    Reviewer
  • Member since: 2019

  • Organization: EAG labs



  • Ease of use
    5 out of 5
    After sales service
    4 out of 5
    Value for money
    5 out of 5
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Overall very strong performance.
Rating: 4.7

  • Application Area: Material characterization from a variety of industries

"The performance of the detector is as advertised. The all-new design with the CMOS detector increases the collection speed by about 10 times. This is very helpful for larger area acquisition and semiconductive samples. The control software has built-in large area scanning and stitching functions. I took one star off in after sales care even though our local engineers have been very responsible and helpful. This reflects the tool itself needs quite some after sale care. We have had to wait for a replacement of the computer that controls the detector for a couple of weeks. The phosphor screen of our detector has some oil leaking that contaminates the screen so it had to be replaced 3-4 times. Our engineer thinks that the excess oil is from the factory and is very timely at changing it every time the issue occurs. However we weren't able to get a "final" fix for this. That's why the one star off."

Review date: 30 Oct 2019 | Symmetry® S2

Symmetry S2, based on the pioneering Symmetry detector, uses customised CMOS technology for superior performance and ease of use. CMOS-based cameras allow for both speed and sensitivity. The high sensitivity of Symmetry S2 means that even challenging samples such as thin films or complex oxides can be imaged with high data quality and with an order of magnitude increase in acquisition speed when compared to both ‘fast’ and ‘sensitive’ traditional CCD detectors.

Features

  • >4500 indexed patterns per second (pps)
  • Unique fibre-optic coupling with sub-pixel distortion
  • High sensitivity for low kV 
  • Low current analyses
  • 1244x1024 pixel resolution

Product Overview

Symmetry® S2 by Oxford Instruments NanoAnalysis product image

Symmetry® S2

Manufacturer Oxford Instruments NanoAnalysis  |  Available Worldwide

4.7 / 5.0 | 1 reviews