QUANTAX Micro-XRF by Bruker-Nano

Manufacturer Bruker-Nano
QUANTAX Micro-XRF with Xtrace - Upgrading SEMs for Trace Element Analysis QUANTAX Micro-XRF with the XTrace micro-spot X-ray source adds the capabilities of a complete micro-XRF spectrometer to a scanning electron microscope. XTrace fits on a free inclined chamber port of almost any SEM. The user benefits from both the trace element sensitivity and the higher information depth of XRF analysis. QUANTAX Micro-XRF Features: Distribution analysis with HyperMap stores complete spectra for e... Read more


QUANTAX Micro-XRF by Bruker-Nano product image
QUANTAX Micro-XRF

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QUANTAX Micro-XRF with Xtrace - Upgrading SEMs for Trace Element Analysis

QUANTAX Micro-XRF with the XTrace micro-spot X-ray source adds the capabilities of a complete micro-XRF spectrometer to a scanning electron microscope. XTrace fits on a free inclined chamber port of almost any SEM. The user benefits from both the trace element sensitivity and the higher information depth of XRF analysis.

QUANTAX Micro-XRF Features:

  • Distribution analysis with HyperMap stores complete spectra for every map point for on- and offline analysis.
  • Samples can be analyzed with Micro-XRF and EDS without position change.
  • Both methods are integrated in the same analytical software suite - ESPRIT 2.0.
  • No interference with normal SEM operation, XTrace can stay in its measurement position most of the time.
  • Analytical results compare to those of standalone systems.
  • Image tiling allows mapping large areas.
  • Selectable primary radiation filters to suppress diffraction peaks.
  • Uses the SEM motorized stage.
  • Allows sample tilt to produce minimum spot sizes.

Product Overview

QUANTAX Micro-XRF by Bruker-Nano product image