Park NX-Hivac Atomic Force Microscope
High-vacuum AFM for controlled-environment nanoscale surface analysis
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The Park NX-Hivac Atomic Force Microscope is a high-vacuum AFM system designed for nanoscale surface characterization under controlled environmental conditions. By operating in vacuum, the NX-Hivac reduces the influence of air, humidity, and contamination, enabling more stable and reliable measurements of sensitive and advanced materials.
Built on Park Systems’ non-contact AFM technology, the NX-Hivac provides accurate topographical and material property measurements while minimizing tip and sample damage. Its vacuum-compatible design supports high-resolution imaging and repeatable data acquisition, making it suitable for demanding research applications.
The NX-Hivac is well suited for advanced materials science and semiconductor research, where precise surface analysis under controlled conditions is essential.
Key Features:
- High-vacuum AFM operation for controlled measurements
- Non-contact AFM technology for accurate, low-damage imaging
- Reduced environmental influence on surface analysis
- Designed for advanced research applications
Intrinsic electrical characterization of two-dimensional transition metal dichalcogenides via scanning probe microscopy
In this application note, scanning probe microscopy (SPM) is used to investigate the intrinsic electrical properties of as-deposited 2D TMDs. Conductive atomic force microscope (C-AFM) is performed directly on the surface of as-grown 2D materials without any patterning using a Park NX-Hivac AFM.
Intrinsic electrical characterization of two-dimensional transition metal dichalcogenides via scanning probe microscopy
Suitable techniques to characterize the intrinsic physical and electrical properties of as-deposited 2D materials, are a key link between the quality of as-deposited 2D materials and the performance of 2D materials-based electronic devices. In this application note, Park Systems investigates the intrinsic electrical properties of as-deposited 2D TMDs, utilizing scanning probe microscopy (SPM).
Carrier profiling in high vacuum using scanning spreading resistance microscopy and scanning capacitance microscopy
In this application note by Park Systems, the performance of the Park NX-Hivac atomic force microscope (AFM) was reviewed for SSRM and SCM applications.
