JSM-7900F is JEOL’s flagship FE-SEM which combines extreme high-resolution imaging, enhanced stability, and exceptional ease of use for any level of operator in a multi-purpose environment.
JSM-7900F
Average Rating: 4.9
2 Scientists have reviewed this product
Status:
Reviewer
Member since: 2022
Organization: SABIC Innovative Plastics BV
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- Ease of use
- After sales service
- Value for money
Great to become first responsible for this Electron Microscope
Rating: 4.7
Application Area: Plastics, polymers
"User friendly, easy to use, little downtime."
Review date: 04 Jan 2022 | JSM-7900F
Status:
Reviewer Member since: 2020
Organization: Northwestern University
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- Ease of use
- After sales service
- Value for money
Very easy to use and can get great images quickly.
Rating: 5.0
Review date: 18 Jun 2021 | JSM-7900F
Application Area:SEM and SEM-EDS
"Sample loading is easy and robust, alignment is straightforward and the resolution is wonderful."
Review date: 18 Jun 2021 | JSM-7900F
JSM-7900F is JEOL’s flagship FE-SEM which combines extreme high-resolution imaging, enhanced stability, and exceptional ease of use for any level of operator in a multi-purpose environment.
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