Dimension IconIR
Bruker’s large-sample Dimension IconIR system combines nanoscale infrared (IR) spectroscopy and scanning probe microscopy (SPM) on one platform to deliver the most advanced spectroscopy, imaging, and property mapping capabilities available for academic researchers and industrial users. Incorporating decades of research and technological innovation, IconIR provides unrivaled performance based on and building off the industry-b…
Dimension IconIR AFM-IR spectrometer
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Highest performance, large-sample nanoIR with PeakForce property mapping.
Dimension IconIR utilizes Bruker-exclusive PeakForce Tapping® nanoscale property mapping and proprietary nanoIR spectroscopy technology to enable correlative microscopy for nanochemical, nanoelectrical, and nanomechanical characterization of materials and active nanoscale systems in electrical or chemically reactive environments.
Only Dimension IconIR delivers:
- High-performance nanoIR spectroscopy with FT-IR correlation, <10 nm chemical resolution, and monolayer sensitivity.
- Correlative chemical imaging with PeakForce Tapping nanomechanical and nanoelectrical modes.
- Highest-performance AFM imaging and ultimate sample flexibility.
- The broadest range of applications accessories and AFM modes.
