8 webinars to advance your electron microscopy through direct detection
This SelectScience webinar series, developed in collaboration with Quantum Detectors, is an education-led programme for the electron microscopy community, focused on what modern direct electron detection enables in practice.
Across eight expert-led sessions, the series explores how advances in detection are translating into real experimental outcomes – from improved diffraction data and lower-dose experiments, to faster acquisition, event-based analysis, more reliable 4D-STEM workflows, in situ microscopy, and emerging techniques such as ptychography. Led by credible external researchers and experts, the programme delivers practical, application-driven insight into how these approaches are being applied across materials science, electron microscopy, crystallography, semiconductor research, and advanced functional materials.
Join us for this free webinar series to hear from leading experts and see how these advances are being used across real-world electron microscopy workflows:
Tuesday, September 8 at 14:00 BST | 15:00 CEST | 09:00 EDT | 06:00 PDT
Managing 4D-STEM data with smarter acquisition
Arno Annys, Ph.D. Researcher in Electron Microscopy for Materials Science at University of Antwerp, will demonstrate how event-driven electron detection can provide a more efficient representation of electron signals and help streamline the workflow from experiment to scientific insight. Join to learn how these approaches can make advanced 4D-STEM experiments more scalable, responsive, and accessible for routine use.
Register free
WATCH ON DEMAND
Expanding the 4D‑STEM toolbox for advanced materials characterization
Dr. Stefano Vespucci and Dr. Matúš Krajňák compare frame‑based and data‑driven acquisition modes, discuss key detector performance considerations, and demonstrate how Timepix4 capabilities support high‑resolution four‑dimensional scanning transmission electron microscopy (4D‑STEM). They also explore the potential of event‑driven acquisition and timestamping tech for next‑gen electron microscopy.
Register freeExplore the latest 4D-STEM webinars, all on demand
Our previous three-part webinar series explored the Merlin T4 from Quantum Detectors: the first hybrid pixel detector to combine frame-based and event-based imaging in a single system. From capturing elusive skyrmions to enabling ultrafast 4D-STEM and ptychography, this series showcases how hybrid detection is set to transform the future of transmission electron microscopy (TEM).
How to capture skyrmions and beam sensitive materials with precision
Watch on demandDr. Matúš Krajňák, Application Scientist, Quantum Detectors, discusses how the Merlin T4 supports a wide range of applications in materials science and semiconductor research and was featured in recent academic publications.
Next-gen 4D-STEM and quantitative imaging with Timepix4
Watch on demandProfessor Knut Müller-Caspary, LMU Munich & Ernst-Ruska Centre, and Matt Callahan, Quantum Detectors, showcase the technologies that can enable new levels of precision in electric field mapping, charge density analysis, and ptychographic phase retrieval.
Probing beam sensitive materials while preserving sample integrity
Watch on demandDr. Sean Collins, University of Leeds, and Kumar Vaidikar, Quantum Detectors, unveil cutting-edge low-dose 4D-STEM and single-atom electron energy loss spectroscopy (EELS) methods that push measurements to the very limit of detection while preserving sample integrity.
All webinars are free to attend online and participants can request a certificate of attendance, including a learning outcomes summary, for continuing education purposes.
