Managing the 4D-STEM Data Explosion: Event-Driven Acquisition, Adaptive Scanning and Real-Time Ptychography

Tuesday, September 8 at 14:00 BST | 15:00 CEST | 09:00 EDT | 06:00 PDT

Modern pixelated detectors can generate tens to hundreds of gigabytes of data during a single 4D-STEM scan, creating practical challenges for acquisition, processing and interpretation.

This webinar will demonstrate how event-driven electron detection can provide a more efficient representation of the electron signal and help streamline the workflow from experiment to scientific insight.

Using application-based examples, Arno Annys will explore how event-driven acquisition, adaptive scanning strategies and real-time ptychographic reconstruction can reduce the 4D-STEM data burden, support low-dose experiments and provide immediate feedback during acquisition.

Attendees will learn how these approaches can make advanced 4D-STEM experiments more scalable, responsive and accessible for routine use.

Certificate of attendance
If you attend the live webinar, you will automatically receive a certificate of attendance, including a learning outcomes summary, for continuing education purposes.

If you view the on-demand webinar, you can request a certificate of attendance by emailing editor@selectscience.net.

Webinar details

Cost: Free to attend
Location: Online
Duration: 60 minutes

Registration is required to secure your place. If you register but can’t attend live, you will receive a link to the on‑demand recording once it becomes available.

Speakers

Arno Annys

Speaker

PhD Researcher, Electron Microscopy for Materials Science, University of Antwerp

Todd Beanlands

Moderator

Science Editor, SelectScience

Who should attend?

This event is perfect for individuals working in:

Electron microscopists, materials scientists, physicists and instrument scientists working with STEM, 4D-STEM, ptychography, diffraction imaging or electron energy-loss spectroscopy
Researchers investigating beam-sensitive materials, developers of microscopy acquisition and processing workflows, facility managers, and scientists considering the adoption of event-driven direct electron detection

Featured products

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Merlin T4

Quantum Detectors

Merlin T4 is a cutting-edge hybrid pixel detector engineered for ultrafast applications in STEMs. Ideal for 4D-STEM, ultrafast diffraction, and ultrafast TEM imaging of dynamic processes from all types of samples, including beam-sensitive materials.

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What will this webinar cover?

Key learning objectives:

Understand how event-driven detection changes the way 4D-STEM data are acquired, represented and processed.
Discover how adaptive scanning strategies can improve experimental flexibility and focus acquisition on the most scientifically valuable regions.
Learn how event-by-event ptychographic reconstruction can provide rapid feedback during an experiment.
See practical examples of how event-driven workflows can reduce data volumes and support low-dose and beam-sensitive applications.